1-Thru Deembedding Method for One-Port Microwave Device Characterization

Wang, X; Wang, W; Liang, Y; Jin, R

1-Thru Deembedding Method for One-Port Microwave Device Characterization

Wang, X Wang, W Liang, Y Jin, R

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Publisher:: Institute of Electrical and Electronics Engineers (IEEE)
Publication Type:: Journal Article
Citation:: IEEE Microwave and Wireless Components Letters, 2022, 32, (4), pp. 355-358
Issue Date:: 2022-04-01

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Field	Value	Language
dc.contributor.author	Wang, X
dc.contributor.author	Wang, W
dc.contributor.author	Liang, Y
dc.contributor.author	Jin, R
dc.date.accessioned	2023-06-26T02:40:45Z
dc.date.available	2023-06-26T02:40:45Z
dc.date.issued	2022-04-01
dc.identifier.citation	IEEE Microwave and Wireless Components Letters, 2022, 32, (4), pp. 355-358
dc.identifier.issn	1531-1309
dc.identifier.issn	1558-1764
dc.identifier.uri	http://hdl.handle.net/10453/170874
dc.description.abstract	In this letter, a 1-thru deembedding method for one-port microwave device characterization is presented. Only one standard 'thru' is used in the proposed deembedding process. Reliable device models can be developed by the proposed method for EM/circuit cosimulation. The proposed method is verified by the deembedding process of a surface-mount p-i-n diode. Furthermore, the deembedded results are utilized in the EM/circuit cosimulation of a reconfigurable filter. The reconfigurable filter is fabricated and measured for verification. Good agreement is achieved between the experimental and simulated results.
dc.language	en
dc.publisher	Institute of Electrical and Electronics Engineers (IEEE)
dc.relation.ispartof	IEEE Microwave and Wireless Components Letters
dc.relation.isbasedon	10.1109/LMWC.2021.3128251
dc.rights	info:eu-repo/semantics/closedAccess
dc.subject	0205 Optical Physics, 0906 Electrical and Electronic Engineering, 1005 Communications Technologies
dc.subject.classification	Networking & Telecommunications
dc.title	1-Thru Deembedding Method for One-Port Microwave Device Characterization
dc.type	Journal Article
utslib.citation.volume	32
utslib.for	0205 Optical Physics
utslib.for	0906 Electrical and Electronic Engineering
utslib.for	1005 Communications Technologies
pubs.organisational-group	/University of Technology Sydney
pubs.organisational-group	/University of Technology Sydney/Faculty of Engineering and Information Technology
pubs.organisational-group	/University of Technology Sydney/Faculty of Engineering and Information Technology/School of Electrical and Data Engineering
utslib.copyright.status	closed_access	*
dc.date.updated	2023-06-26T02:40:44Z
pubs.issue	4
pubs.publication-status	Published
pubs.volume	32
utslib.citation.issue	4

Abstract:

In this letter, a 1-thru deembedding method for one-port microwave device characterization is presented. Only one standard 'thru' is used in the proposed deembedding process. Reliable device models can be developed by the proposed method for EM/circuit cosimulation. The proposed method is verified by the deembedding process of a surface-mount p-i-n diode. Furthermore, the deembedded results are utilized in the EM/circuit cosimulation of a reconfigurable filter. The reconfigurable filter is fabricated and measured for verification. Good agreement is achieved between the experimental and simulated results.

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http://hdl.handle.net/10453/170874