Browsing byAuthorBonevich, JE
Showing results 1 to 3 of 3
Issue Date | Title | Author(s) |
2004-01-01 | Bayesian inference of nanoparticle-broadened x-ray line profiles | Armstrong, N; Kalceff, W; Cline, JP; Bonevich, JE |
2004-01 | A Bayesian/Maximum Entropy Method for Certification of a Nanocrystalline-Size NIST Reference Material | Armstrong, NG; Kalceff, W; Cline, JP; Bonevich, JE; Mittemeijer, EJ; Scardi, P |
2004-01 | X-ray diffraction characterisation of nanoparticles size and shape distributions: application to bimodal distributions | Armstrong, NG; Kalceff, W; Cline, JP; Bonevich, JE; Lynch, PA; Tang, C; Thompson, S; Savvides, N |