| Issue Date | Title | Author(s) |
| 2006-10-01 | Carrier diffusion processes near threading dislocations in GaN and GaN:Si characterized by low voltage cathodoluminescence | Pauc, N; Phillips, MR; Aimez, V; Drouin, D |
| 2006 | Carrier recombination near threading dislocations in GaN epilayers by low voltage cathodoluminescence | Pauc, N; Aimez, V; Drouin, D; Phillips, M |
| 2006-08-01 | Comparison of low voltage cathodoluminescent phosphors | Phillips, MR; Drouin, D |
| 2006-01 | Comparison of Low Voltage Cathodoluminescent Phosphors | Phillips, M; Drouin, D |
| 1999-07-05 | Depletion layer imaging using a gaseous secondary electron detector in an environmental scanning electron microscope | Phillips, MR; Toth, M; Drouin, D |
| 2006-08-01 | Effects of lithium doping and post-processing on the cathodoluminescence of zinc oxide nanoparticles | McBean, KE; Phillips, MR; Drouin, D |
| 2002 | ESEM beam current measuring device based on a planar shotty diode | Aubin, A; Drouin, D; Phillips, M; Voelkl E; Piston D; Gauvin R; Lockley AJ; Bailey GW; Mickernan S |
| 2009-07-01 | Imaging fundamental electronic excitations at high spatial resolution using scanning cathodoluminescence microscopy | Phillips, MR; Drouin, D; Moody, SJ; Ton-That, C |
| 2006-01 | Probing Carrier Behavior at the Nanoscale in Gallium Nitride using Low Voltage Cathodoluminescence | Phillips, M; Drouin, D; Goldys, EM |
| 2006-01 | Probing carrier behaviour at the nanoscale in gallium nitride using low voltage cathodoluminescence | Phillips, M; Drouin, D; Pauc, N; Kotula, P; marko, M; Scott, JH; Gauvin, R; Beniac, D; Lucas, G; mcKernan, S; Shields, J |
| 2010 | Response to 'Comment on 'Carrier recombination near threading dislocations in GaN epilayers by low voltage cathodoluminescence'' | Pauc, N; Phillips, M; Aimez, V; Drouin, D |
| 2006-12-01 | SEM characterization of nanodevices and nanomaterials | Drouin, D; Pauc, N; Phillips, M; Poissant, P; Delample, V; Souifi, A; Aimez, V; Beauvais, J |
| 2012-12-01 | Three-dimensional electron energy deposition modeling of cathodoluminescence emission near threading dislocations in gan and electron-beam lithography exposure parameters for a PMMA resist | Demers, H; Poirier-Demers, N; Phillips, MR; De Jonge, N; Drouin, D |
| 2001-01 | X-Ray Micronalaysis in the Environmentl SEM Using Mapping and Fourier Deconvolution Techniques | Phillips, M; Griffin, B; Drouin, D; Nockolds, C; Remond, G; Lyman, C |
