Showing results 140 to 159 of 171
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| Issue Date | Title | Author(s) |
| 2005-11-07 | Revisiting electrochromism in InN | Scott, K; Butcher, A; Wintrebert-Fouquet, M; Chen, PPT; Wuhrer, R; Phillips, MR |
| 2004-08-15 | Scanning tunneling and cathodoluminescence spectroscopy of indium nitride | Phillips, MR; Zareie, MH; Gelhausen, O; Drago, M; Schmidtling, T; Richter, W |
| 2006-01-01 | Scanning tunnelling spectroscopy of quantized electron accumulation at in <inf>x</inf>Ga <inf>1-x</inf>N surfaces | Veal, TD; Piper, LFJ; Phillips, MR; Zareie, MH; Lu, H; Schaff, WJ; McConville, CF |
| 2014-01-01 | Shallow carrier traps in hydrothermal ZnO crystals | Ton-That, C; Lem, LLC; Phillips, MR; Reisdorffer, F; Mevellec, J; Nguyen, TP; Nenstiel, C; Hoffmann, A |
| 2014-01-01 | Single photon emission from ZnO nanoparticles | Choi, S; Johnson, BC; Castelletto, S; Ton-That, C; Phillips, MR; Aharonovich, I |
| 2018-10-10 | Spatial Distribution of Defect Luminescence in ZnO Nanorods: An Investigation by Spectral Cathodoluminescence Imaging | Zhu, L; Lockrey, M; Phillips, MR; Ton-That, C |
| 2001-12-01 | Strain relaxation in GaN<inf>x</inf>P<inf>1-x</inf> alloy: Effect on optical properties | Buyanova, IA; Chen, WM; Goldys, EM; Phillips, MR; Xin, HP; Tu, CW |
| 2006-10-12 | Structural and electronic properties of Fe3+ and Fe2+ centers in GaN from optical and EPR experiments | Malguth, E; Hoffmann, A; Gehlhoff, W; Gelhausen, O; Phillips, MR; Xu, X |
| 2013-01-01 | Structural and optical investigation of non-polar (1-100) GaN grown by the ammonothermal method | Gogova, D; Petrov, PP; Buegler, M; Wagner, MR; Nenstiel, C; Callsen, G; Schmidbauer, M; Kucharski, R; Zajac, M; Dwilinski, R; Phillips, MR; Hoffmann, A; Fornari, R |
| 2011-01-01 | Structural characterization of B-doped diamond nanoindentation tips | Sprouster, DJ; Ruffell, S; Bradby, JE; Williams, JS; Lockrey, MN; Phillips, MR; Major, RC; Warren, OL |
| 2012-09-01 | Structural investigations of silicon nanostructures grown by self-organized island formation for photovoltaic applications | Roczen, M; Schade, M; Malguth, E; Callsen, G; Barthel, T; Gref, O; Töfflinger, JA; Schöpke, A; Schmidt, M; Leipner, HS; Ruske, F; Phillips, MR; Hoffmann, A; Korte, L; Rech, B |
| 2017-01-01 | A study into the impact of sapphire substrate orientation on the properties of nominally-undoped β-Ga<inf>2</inf>O<inf>3</inf> thin films grown by pulsed laser deposition | Teherani, FH; Rogers, DJ; Sandana, VE; Bove, P; Ton-That, C; Lem, LLC; Chikoidze, E; Neumann-Spallart, M; Dumont, Y; Huynh, T; Phillips, MR; Chapon, P; McClintock, R; Razeghi, M |
| 2008-07-11 | Surface electronic properties of ZnO nanoparticles | Ton-That, C; Phillips, MR; Foley, M; Moody, SJ; Stampfl, APJ |
| 2006-08-01 | Synthesis and characterization of doped and undoped ZnO nanostructures | McBean, KE; Phillips, MR; Goldys, EM |
| 2014-01-01 | Tailoring deep level surface defects in ZnO nanorods for high sensitivity ammonia gas sensing | Anantachaisilp, S; Smith, SM; Ton-That, C; Osotchan, T; Moon, AR; Phillips, MR |
| 2020-02-28 | The role of surface depletion layer effects on the enhancement of the UV emission in ZnO induced by a nanostructured Al surface coating | Fiedler, S; Lee Cheong Lem, LO; Ton-That, C; Phillips, MR |
| 2005-01-01 | Thin films of ZnO and ZnMnO by atomic layer epitaxy | Wojcik, A; Kopalko, K; Godlewski, M; Lusakowska, E; Guziewicz, E; Minikayev, R; Paszkowicz, W; Swiatek, K; Klepka, M; Jakiela, R; Kiecana, M; Sawicki, M; Dybko, K; Phillips, MR |
| 2012-12-01 | Three-dimensional electron energy deposition modeling of cathodoluminescence emission near threading dislocations in gan and electron-beam lithography exposure parameters for a PMMA resist | Demers, H; Poirier-Demers, N; Phillips, MR; De Jonge, N; Drouin, D |
| 2002-11-20 | Time resolved analysis of the positive ion dynamics in the variable pressure scanning electron microscope | Phillips, MR; Morgan, SW |
| 2011-10-07 | Titanium-assisted growth of silica nanowires: From surface-matched to free-standing morphologies | Callsen, G; Reparaz, JS; Wagner, MR; Vierck, A; Phillips, MR; Thomsen, C; Hoffmann, A |
