Showing results 154 to 171 of 171
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| Issue Date | Title | Author(s) |
| 2014-01-01 | Tailoring deep level surface defects in ZnO nanorods for high sensitivity ammonia gas sensing | Anantachaisilp, S; Smith, SM; Ton-That, C; Osotchan, T; Moon, AR; Phillips, MR |
| 2020-02-28 | The role of surface depletion layer effects on the enhancement of the UV emission in ZnO induced by a nanostructured Al surface coating | Fiedler, S; Lee Cheong Lem, LO; Ton-That, C; Phillips, MR |
| 2005-01-01 | Thin films of ZnO and ZnMnO by atomic layer epitaxy | Wojcik, A; Kopalko, K; Godlewski, M; Lusakowska, E; Guziewicz, E; Minikayev, R; Paszkowicz, W; Swiatek, K; Klepka, M; Jakiela, R; Kiecana, M; Sawicki, M; Dybko, K; Phillips, MR |
| 2012-12-01 | Three-dimensional electron energy deposition modeling of cathodoluminescence emission near threading dislocations in gan and electron-beam lithography exposure parameters for a PMMA resist | Demers, H; Poirier-Demers, N; Phillips, MR; De Jonge, N; Drouin, D |
| 2002-11-20 | Time resolved analysis of the positive ion dynamics in the variable pressure scanning electron microscope | Phillips, MR; Morgan, SW |
| 2011-10-07 | Titanium-assisted growth of silica nanowires: From surface-matched to free-standing morphologies | Callsen, G; Reparaz, JS; Wagner, MR; Vierck, A; Phillips, MR; Thomsen, C; Hoffmann, A |
| 2006-03-01 | Transient analysis of gaseous electron-ion recombination in the environmental scanning electron microscope | Morgan, SW; Phillips, MR |
| 2008-04-21 | Tuning the bandgap of InAs quantum dots by selective-area MOCVD | Mokkapati, S; Wong-Leung, J; Tan, HH; Jagadish, C; McBean, KE; Phillips, MR |
| 2022-03-01 | Two-dimensional confinement of excitons at the interface in nonpolar MgZnO/ZnO heterostructures | Zakria, M; Rogers, DJ; Scola, J; Zhu, L; Lockrey, M; Bove, P; Sandana, EV; Teherani, FH; Phillips, MR; Ton-That, C |
| 1997-01-01 | Type I and type II alignment of the light hole band in In<inf>0.15</inf>Ga<inf>0.85</inf>As/GaAs and in In<inf>0.15</inf>Ga<inf>0.85</inf>As/Al<inf>0.15</inf>Ga<inf>0.85</inf>As strained quantum wells | Goldys, EM; Zuo, HY; Phillips, MR; Contessa, CM; Vaughan, MR; Tansley, TL |
| 2019-12-01 | Vacancy cluster in ZnO films grown by pulsed laser deposition | Wang, Z; Luo, C; Anwand, W; Wagner, A; Butterling, M; Rahman, MA; Phillips, MR; Ton-That, C; Younas, M; Su, S; Ling, FCC |
| 2012-12-01 | Very early poststroke aphasia therapy: A pilot randomized controlled efficacy trial | Godecke, E; Hird, K; Lalor, EE; Rai, T; Phillips, MR |
| 2016-07-15 | Wafer-scale epitaxial lift-off of optoelectronic grade GaN from a GaN substrate using a sacrificial ZnO interlayer | Rajan, A; Rogers, DJ; Ton-That, C; Zhu, L; Phillips, MR; Sundaram, S; Gautier, S; Moudakir, T; El-Gmili, Y; Ougazzaden, A; Sandana, VE; Teherani, FH; Bove, P; Prior, KA; Djebbour, Z; McClintock, R; Razeghi, M |
| 2006-08-01 | X-ray mapping and post processing | Wuhrer, R; Moran, K; Phillips, MR |
| 2010-10-01 | X-ray mapping and scatter diagram analysis of the discoloring products resulting from the interaction of artist's pigments | White, R; Thomas, P; Phillips, MR; Moran, K; Wuhrer, R |
| 2006-08-01 | X-ray mapping using a multiple-EDS (DUAL) detectors | Wuhrer, R; Moran, K; Phillips, MR; Davey, P |
| 2002-11-20 | X-ray microanalysis of insulators in a variable pressure environment | Toth, M; Craven, JP; Phillips, MR; Thiel, BL; Donald, AM |
| 2002-03-15 | X-ray spectrometry investigation of electrical isolation in GaN | Kucheyev, SO; Toth, M; Phillips, MR; Williams, JS; Jagadish, C; Li, G |
