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Showing results 165 to 170 of 170
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Issue Date
Title
Author(s)
2016-07-15
Wafer-scale epitaxial lift-off of optoelectronic grade GaN from a GaN substrate using a sacrificial ZnO interlayer
Rajan, A
;
Rogers, DJ
;
Ton-That, C
;
Zhu, L
;
Phillips, MR
;
Sundaram, S
;
Gautier, S
;
Moudakir, T
;
El-Gmili, Y
;
Ougazzaden, A
;
Sandana, VE
;
Teherani, FH
;
Bove, P
;
Prior, KA
;
Djebbour, Z
;
McClintock, R
;
Razeghi, M
2006-08-01
X-ray mapping and post processing
Wuhrer, R
;
Moran, K
;
Phillips, MR
2010-10-01
X-ray mapping and scatter diagram analysis of the discoloring products resulting from the interaction of artist's pigments
White, R
;
Thomas, P
;
Phillips, MR
;
Moran, K
;
Wuhrer, R
2006-08-01
X-ray mapping using a multiple-EDS (DUAL) detectors
Wuhrer, R
;
Moran, K
;
Phillips, MR
;
Davey, P
2002-11-20
X-ray microanalysis of insulators in a variable pressure environment
Toth, M
;
Craven, JP
;
Phillips, MR
;
Thiel, BL
;
Donald, AM
2002-03-15
X-ray spectrometry investigation of electrical isolation in GaN
Kucheyev, SO
;
Toth, M
;
Phillips, MR
;
Williams, JS
;
Jagadish, C
;
Li, G