Browsing by Author Toth, M

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Showing results 90 to 104 of 104< previous 
Issue DateTitleAuthor(s)
2007Secondary electron imaging at gas pressures in excess of 1 kPaToth, M; Uncovsky, M; Knowles, W; Baker, FS
1-Jan-2014Silicon carbide goes quantumAharonovich, I; Toth, M
7-Jan-2016Silicon oxide nanowire growth mechanisms revealed by real-time electron microscopyKolíbal, M; Novák, L; Shanley, T; Toth, M; Šikola, T
28-Feb-2018Single crystal diamond membranes for nanoelectronicsBray, K; Kato, H; Previdi, R; Sandstrom, R; Ganesan, K; Ogura, M; Makino, T; Yamasaki, S; Magyar, AP; Toth, M; Aharonovich, I
7-May-2018Single photon emission from plasma treated 2D hexagonal boron nitrideXu, ZQ; Elbadawi, C; Tran, TT; Kianinia, M; Li, X; Liu, D; Hoffman, TB; Nguyen, M; Kim, S; Edgar, JH; Wu, X; Song, L; Ali, S; Ford, M; Toth, M; Aharonovich, I
2013Spontaneous Growth of Gallium-Filled Microcapillaries on Ion-Bombarded GaNBotman, A; Bahm, AS; Randolph, S; Straw, M; Toth, M
25-Sep-2013Spontaneous growth of gallium-filled microcapillaries on ion-bombarded GaNBotman, A; Bahm, A; Randolph, S; Straw, M; Toth, M
16-Jan-2007Structure of low-density nanoporous dielectrics revealed by low-vacuum electron microscopy and small-angle X-ray scatteringKucheyev, SO; Toth, M; Baumann, TF; Hamza, AV; Ilavsky, J; Knowles, WR; Saw, CK; Thiel, BL; Tileli, V; Van Buuren, T; Wang, YM; Willey, TM
21-May-2014Subtractive 3d printing of optically active diamond structuresMartin, AA; Toth, M; Aharonovich, I
-Super-resolution imaging of quantum emitters in layered materialsKianinia, M; Bradac, C; Wang, F; Sontheimer, B; Tran, TT; Nguyen, M; Kim, S; Xu, Z-Q; Jin, D; Schell, AW; Lobo, CJ; Aharonovich, I; Toth, M
1-Jan-2016Ultra-bright emission from hexagonal boron nitride defects as a new platform for bio-imaging and bio-labellingElbadawi, C; Tran, TT; Shimoni, O; Totonjian, D; Lobo, CJ; Grosso, G; Moon, H; Englund, DR; Ford, MJ; Aharonovich, I; Toth, M
7-Feb-2016Versatile method for template-free synthesis of single crystalline metal and metal alloy nanowiresScott, JA; Totonjian, D; Martin, AA; Tran, TT; Fang, J; Toth, M; McDonagh, AM; Aharonovich, I; Lobo, CJ
Jan-2002X-ray microanalysis of insulators in a variable pressure environmentToth, M; Craven, JP; Phillips, M; Thiel, BL; Donald, AM; Voelkl, E; Piston, D; Gauvin, R; Lockley, AJ; Bailey, GW; Mickernan, S
20-Nov-2002X-ray microanalysis of insulators in a variable pressure environmentToth, M; Craven, JP; Phillips, MR; Thiel, BL; Donald, AM
15-Mar-2002X-ray spectrometry investigation of electrical isolation in GaNKucheyev, SO; Toth, M; Phillips, MR; Williams, JS; Jagadish, C; Li, G