Browsing byAuthorWijerathna, B
Showing results 4 to 4 of 4< previous
| Issue Date | Title | Author(s) |
|---|---|---|
| 2013-06-05 | Multiple defect interpretation based on Gaussian processes for MFL technology | Wijerathna, B; Vidal-Calleja, T; Kodagoda, S; Zhang, Q; Miro, JV |