Browsing byAuthorArmstrong, NG
Showing results 1 to 8 of 8
| Issue Date | Title | Author(s) |
| 2006-01 | Considerations concerning Wilkens theory of dislocation line-broadening | Armstrong, NG; Leoni, M; Scardi, P |
| 2006-01 | Analysis of admixed CeO2 nanoparticles via TEM and x-ray diffraction techniques | Vella, A; Whitley, RJ; Armstrong, NG; Dowd, AR; Cline, JP; Avdeev, M |
| 2006-01 | Bayesian analysis of band-broadening models used in high performance liquid chromatography | Armstrong, NG |
| 2005-01 | Characterisation of atomic layer deposition using x-ray reflectometry | Windover, D; Armstrong, NG; Cline, JP; Hung, PY; Diebold, A; Seiler, DG; Diebold, AC; McDonald, R; Ayre, CR; Khosla, RP; Zollner, S; Secula, EM |
| 2005-01 | Bayesian analysis of ceria nanoparticles from line profile data | Armstrong, NG; Dowd, AR; Cline, JP; Kalceff, W; Huang, TC |
| 2004-01 | Determining the dislocation contrast factor for x-ray line profile analysis | Armstrong, NG; Lynch, PA; Mittemeijer, EJ; Scardi, P |
| 2004-01 | X-ray diffraction characterisation of nanoparticles size and shape distributions: application to bimodal distributions | Armstrong, NG; Kalceff, W; Cline, JP; Bonevich, JE; Lynch, PA; Tang, C; Thompson, S; Savvides, N |
| 2004-01 | A Bayesian/Maximum Entropy Method for Certification of a Nanocrystalline-Size NIST Reference Material | Armstrong, NG; Kalceff, W; Cline, JP; Bonevich, JE; Mittemeijer, EJ; Scardi, P |
