| Issue Date | Title | Author(s) |
| 2021-01-01 | Attitudes, barriers and facilitators of hospital pharmacists conducting practice-based research: a systematic review | Reali, S; Lee, T; Bishop, J; Mirkov, S; Johnson, J; McCourt, E; Hughes, J; Pont, L; Page, AT; Penm, J |
| 2018-03-27 | Deterministic Nanopatterning of Diamond Using Electron Beams | Bishop, J; Fronzi, M; Elbadawi, C; Nikam, V; Pritchard, J; Fröch, JE; Duong, NMH; Ford, MJ; Aharonovich, I; Lobo, CJ; Toth, M |
| 2015-12-15 | Dynamic Pattern Formation in Electron-Beam-Induced Etching | Martin, AA; Bahm, A; Bishop, J; Aharonovich, I; Toth, M |
| 2012-11-19 | Effects of oxygen on electron beam induced deposition of SiO<inf>2</inf> using physisorbed and chemisorbed tetraethoxysilane | Bishop, J; Toth, M; Phillips, M; Lobo, C |
| 2018-07-25 | Encapsulation-Free Stabilization of Few-Layer Black Phosphorus | Elbadawi, C; Queralt, RT; Xu, ZQ; Bishop, J; Ahmed, T; Kuriakose, S; Walia, S; Toth, M; Aharonovich, I; Lobo, CJ |
| 2017-07 | Formation of Dynamic Topographic Patterns During Electron Beam Induced Etching of Diamond | Martin, AA; Bahm, A; Bishop, J; Aharonovich, I; Toth, M |
| 2014-01-01 | Gas-mediated charged particle beam processing of nanostructured materials | Lobo, CJ; Martin, AA; Elbadawi, C; Bishop, J; Aharonovich, I; Toth, M |
| 2021-06-19 | Metal lability and environmental risk in anthropogenically disturbed Antarctic melt streams | Koppel, DJ; Bishop, J; Kopalová, K; Price, GAV; Brown, KE; Adams, MS; King, CK; Jolley, DF |
| 2018-12-01 | Photonic crystal cavities from hexagonal boron nitride | Kim, S; Fröch, JE; Christian, J; Straw, M; Bishop, J; Totonjian, D; Watanabe, K; Taniguchi, T; Toth, M; Aharonovich, I |
| 2021-01-01 | Recoil Implantation Using Gas-Phase Precursor Molecules | Gale, A; Froech, J; Kianinia, M; Bishop, J; Aharonovich, I; Toth, M |
| 2012-10-03 | Role of activated chemisorption in gas-mediated electron beam induced deposition | Bishop, J; Lobo, CJ; Martin, A; Ford, M; Phillips, M; Toth, M |
| 2020-08-30 | Role of knock-on in electron beam induced etching of diamond | Fronzi, M; Bishop, J; Assadi, MHN; Regan, B; Stampfl, C; Aharonovich, I; Ford, MJ; Toth, M |
| 2022-10-11 | Suppression of Surface Roughening during Ion Bombardment of Semiconductors | Scott, JA; Bishop, J; Toth, M |
