Browsing byAuthorDrouin, D

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Showing results 1 to 14 of 14
Issue DateTitleAuthor(s)
2006-10-01Carrier diffusion processes near threading dislocations in GaN and GaN:Si characterized by low voltage cathodoluminescencePauc, N; Phillips, MR; Aimez, V; Drouin, D
2006Carrier recombination near threading dislocations in GaN epilayers by low voltage cathodoluminescencePauc, N; Aimez, V; Drouin, D; Phillips, M
2006-08-01Comparison of low voltage cathodoluminescent phosphorsPhillips, MR; Drouin, D
2006-01Comparison of Low Voltage Cathodoluminescent PhosphorsPhillips, M; Drouin, D
1999-07-05Depletion layer imaging using a gaseous secondary electron detector in an environmental scanning electron microscopePhillips, MR; Toth, M; Drouin, D
2006-08-01Effects of lithium doping and post-processing on the cathodoluminescence of zinc oxide nanoparticlesMcBean, KE; Phillips, MR; Drouin, D
2002ESEM beam current measuring device based on a planar shotty diodeAubin, A; Drouin, D; Phillips, M; Voelkl E; Piston D; Gauvin R; Lockley AJ; Bailey GW; Mickernan S
2009-07-01Imaging fundamental electronic excitations at high spatial resolution using scanning cathodoluminescence microscopyPhillips, MR; Drouin, D; Moody, SJ; Ton-That, C
2006-01Probing Carrier Behavior at the Nanoscale in Gallium Nitride using Low Voltage CathodoluminescencePhillips, M; Drouin, D; Goldys, EM
2006-01Probing carrier behaviour at the nanoscale in gallium nitride using low voltage cathodoluminescencePhillips, M; Drouin, D; Pauc, N; Kotula, P; marko, M; Scott, JH; Gauvin, R; Beniac, D; Lucas, G; mcKernan, S; Shields, J
2010Response to 'Comment on 'Carrier recombination near threading dislocations in GaN epilayers by low voltage cathodoluminescence''Pauc, N; Phillips, M; Aimez, V; Drouin, D
2006-12-01SEM characterization of nanodevices and nanomaterialsDrouin, D; Pauc, N; Phillips, M; Poissant, P; Delample, V; Souifi, A; Aimez, V; Beauvais, J
2012-12-01Three-dimensional electron energy deposition modeling of cathodoluminescence emission near threading dislocations in gan and electron-beam lithography exposure parameters for a PMMA resistDemers, H; Poirier-Demers, N; Phillips, MR; De Jonge, N; Drouin, D
2001-01X-Ray Micronalaysis in the Environmentl SEM Using Mapping and Fourier Deconvolution TechniquesPhillips, M; Griffin, B; Drouin, D; Nockolds, C; Remond, G; Lyman, C