Browsing by Author McBride, T

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Issue DateTitleAuthor(s)
1-Jan-2009Applying control theory to capability measurement scalesMcBride, T
1-Dec-2008A comparison of the reliability growth of open source and in-House softwareSyed-Mohamad, SM; McBride, T
1-Jan-2014A cynefin based approach to process model tailoring and goal alignmentLepmets, M; O'Connor, RV; Cater-Steel, A; Mesquida, AL; McBride, T
1-Jan-2008Decision-making in software developmentMcBride, T
1-Jan-2009The evolution of software development processes in a university subjectMcBride, T
1-Jun-2012Goal alignment in process improvementLepmets, M; McBride, T; Ras, E
1-Apr-2012ISO/IEC 15504 measurement applied to COBIT process maturityWalker, A; McBride, T; Basson, G; Oakley, R
1-Jan-2012The many forms of process improvement - Results of an international surveyMcBride, T; Lepmets, M
1-Dec-2008The mechanisms of project management of software developmentMcBride, T
1-Jan-2005A metamodel for assessable software development methodologiesGonzalez-Perez, C; McBride, T; Henderson-Sellers, B
14-Apr-2011A method assessment frameworkMcBride, T; Henderson-Sellers, B
1-Dec-2014A method for aggregating ordinal process assessment measuresMcBride, T; Varkoi, T
1-Dec-2013Ontologies for international standards for software engineeringHenderson-Sellers, B; McBride, T; Low, G; Gonzalez-Perez, C
1-Mar-2014An ontology for ISO software engineering standards: 1) Creating the infrastructureHenderson-Sellers, B; Gonzalez-Perez, C; McBride, T; Low, G
1-Jun-2010Organisational theory perspective on process capability measurement scalesMcBride, T
1-Dec-2004Process construction and customizationHenderson-Sellers, B; Serour, M; McBride, T; Gonzalez-Perez, C; Dagher, L
1-Jan-2010Process description elements required for process improvementMcBride, T; Bailey, P
30-Jul-2012Process improvement for the small and agileLepmets, M; McBride, T
1-Dec-2004Project management capability levels: An empirical studyMcBride, T; Henderson-Sellers, B; Zowghi, D
1-Dec-2008Reliability growth of open source software using defect analysisSyed-Mohamad, SM; McBride, T