Browsing byAuthorMittemeijer, EJ
Showing results 1 to 2 of 2
Issue Date | Title | Author(s) |
2004-01 | A Bayesian/Maximum Entropy Method for Certification of a Nanocrystalline-Size NIST Reference Material | Armstrong, NG; Kalceff, W; Cline, JP; Bonevich, JE; Mittemeijer, EJ; Scardi, P |
2004-01 | Determining the dislocation contrast factor for x-ray line profile analysis | Armstrong, NG; Lynch, PA; Mittemeijer, EJ; Scardi, P |