Showing results 60663 to 60682 of 60958
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| Issue Date | Title | Author(s) |
| 17-Oct-2018 | X-Band Low Phase Noise Oscillator Based on Hybrid SIW Cavity Resonator | Zhang, T; Yin, J; Cai, Z; Yang, Y; Bao, J |
| 17-Aug-2018 | An X-band Low Phase Noise Oscillator with High Harmonic Suppression Using SIW Quarter-Wavelength Resonator | Cai, Z; Tang, X; Zhang, T; Yang, Y |
| 2011 | The X-CLAW Self-Aligning Connector for Self-Reconfiguring Modular Robots | Cong, JJ; Fitch, R |
| 31-Oct-2017 | X-ray and Neutron Reflectivity Study Shows That CLIC1 Undergoes Cholesterol-Dependent Structural Reorganization in Lipid Monolayers | Hossain, KR; Holt, SA; Le Brun, AP; Al Khamici, H; Valenzuela, SM |
| 28-Sep-2012 | X-ray crystal structure and specificity of the plasmodium falciparum malaria aminopeptidase PfM18AAP | Sivaraman, KK; Oellig, CA; Huynh, K; Atkinson, SC; Poreba, M; Perugini, MA; Trenholme, KR; Gardiner, DL; Salvesen, G; Drag, M; Dalton, JP; Whisstock, JC; McGowan, S |
| 1-Jan-2006 | X-ray diffraction analysis on crystallite development of nanostructured aluminium | Meijer, E; Armstrong, N; Yeung, WY; Sung, JH; Lee, CG; You, YZ; Lee, YK; Kim, JY |
| Jan-2004 | X-ray diffraction characterisation of nanoparticles size and shape distributions: application to bimodal distributions | Armstrong, NG; Kalceff, W; Cline, JP; Bonevich, JE; Lynch, PA; Tang, C; Thompson, S; Savvides, N |
| 1-Sep-2006 | X-ray mapping and interpretation of scatter diagrams | Moran, K; Wuhrer, R |
| 1-Aug-2006 | X-ray mapping and post processing | Wuhrer, R; Moran, K; Phillips, MR |
| 1-Oct-2010 | X-ray mapping and scatter diagram analysis of the discoloring products resulting from the interaction of artist's pigments | White, R; Thomas, P; Phillips, MR; Moran, K; Wuhrer, R |
| 1-Dec-2006 | X-ray mapping of metallic elements in roll bonded metal laminates | Wuhrer, R; Lee, M; Moran, K; Yeung, WY |
| 1-Aug-2006 | X-ray mapping using a multiple-EDS (DUAL) detectors | Wuhrer, R; Moran, K; Phillips, MR; Davey, P |
| Jan-2005 | X-ray Mapping using Multiple EDS and WDS Detectors | Wuhrer, R; Moran, K; Phillips, M; Davey, P; al, RPE |
| Jan-2002 | X-ray microanalysis of insulators in a variable pressure environment | Toth, M; Craven, JP; Phillips, M; Thiel, BL; Donald, AM; Voelkl, E; Piston, D; Gauvin, R; Lockley, AJ; Bailey, GW; Mickernan, S |
| 20-Nov-2002 | X-ray microanalysis of insulators in a variable pressure environment | Toth, M; Craven, JP; Phillips, MR; Thiel, BL; Donald, AM |
| Jan-2001 | X-Ray Micronalaysis in the Environmentl SEM Using Mapping and Fourier Deconvolution Techniques | Phillips, M; Griffin, B; Drouin, D; Nockolds, C; Remond, G; Lyman, C |
| 5-Sep-2005 | X-ray photoelectron spectroscopy analysis of oxide formation on 8150 aluminium foils | Mansell, M; Heness, G; Yeung, WY |
| 1-Oct-2005 | X-ray reflectivity study of radio frequency sputtered silicon oxide on silicon | Solina, DM; Cheary, RW; Kalceff, W; McCredie, G |
| 15-Mar-2002 | X-ray spectrometry investigation of electrical isolation in GaN | Kucheyev, SO; Toth, M; Phillips, MR; Williams, JS; Jagadish, C; Li, G |
| 1-Dec-2018 | X-ray-induced reduction of a surfactant/polyoxotungstate hybrid compound | Colusso, AV; McDonagh, A; Cortie, MB |
