A Simple Internal Resistance Estimation Method Based on Open Circuit Voltage Test under Different Temperature Conditions

Publication Type:
Conference Proceeding
Citation:
Proceedings - 2018 IEEE International Power Electronics and Application Conference and Exposition, PEAC 2018, 2018
Issue Date:
2018-12-26
Filename Description Size
A Simple Internal Resistance Estimation Method Based on Open Circuit am.pdfAccepted Manuscript version184.07 kB
Adobe PDF
Full metadata record
© 2018 IEEE. State-of-charge (SoC) is one critical parameter for battery management system. SoC cannot be directly measured but it can be estimated according to some information of battery management system such as voltage and current. Two commonly used methods to estimate the SoC are 1) by using current times a constant internal resistance, and 2) by referring to a SoC-resistance lookup table to interface with an open-circuit-voltage (OCV)-SoC lookup table. However, these widely used testing methods of internal resistance have not considered the influence of SoC, temperature and current rate. which are in fact related to internal resistance. Therefore, ignoring the temperature and current rate factors will obtain inaccurate internal resistance measurement and battery SoC estimation. This paper hence proposes a dynamic resistance model with improved accuracy through combining SoC-OCV at different ambient temperatures with different discharging rates defined at the standard ambient temperature (25 degree) condition. The proposed method will not only improve the accuracy but also reduce the testing time.
Please use this identifier to cite or link to this item: