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Issue DateTitleAuthor(s)
2013-11-21Capsule-free fluid delivery and beam-induced electrodeposition in a scanning electron microscopeRandolph, SJ; Botman, A; Toth, M
2018-07-25Encapsulation-Free Stabilization of Few-Layer Black PhosphorusElbadawi, C; Queralt, RT; Xu, ZQ; Bishop, J; Ahmed, T; Kuriakose, S; Walia, S; Toth, M; Aharonovich, I; Lobo, CJ
2001-03-15Depth-resolved cathodoluminescence microanalysis of near-edge emission in III-nitride thin filmsGelhausen, O; Phillips, MR; Toth, M
2018-12-01All-optical control and super-resolution imaging of quantum emitters in layered materialsKianinia, M; Bradac, C; Sontheimer, B; Wang, F; Tran, TT; Nguyen, M; Kim, S; Xu, ZQ; Jin, D; Schell, AW; Lobo, CJ; Aharonovich, I; Toth, M
2010-12-01Gas cascade amplification in ultra-high-resolution environmental scanning electron microcopyToth, M; Thiel, BL; Knowles, WR
2014-01-01Silicon carbide goes quantumAharonovich, I; Toth, M
2002-04-01Electron imaging of dielectrics under simultaneous electron-ion irradiationToth, M; Phillips, MR; Thiel, BL; Donald, AM
2012-11-19Effects of oxygen on electron beam induced deposition of SiO<inf>2</inf> using physisorbed and chemisorbed tetraethoxysilaneBishop, J; Toth, M; Phillips, M; Lobo, C
2016-09-28Electron beam directed etching of hexagonal boron nitrideElbadawi, C; Tran, TT; Kolíbal, M; Šikola, T; Scott, J; Cai, Q; Li, LH; Taniguchi, T; Watanabe, K; Toth, M; Aharonovich, I; Lobo, C
-Direct-write milling of diamond by a focused oxygen ion beamMartin, AA; Randolph, S; Botman, A; Toth, M; Aharonovich, I
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