System for measuring the junction temperature of a light emitting diode immersed in liquid nitrogen

Kirkup, L; Kalceff, W; McCredie, G

System for measuring the junction temperature of a light emitting diode immersed in liquid nitrogen

Kirkup, L Kalceff, W McCredie, G

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Publication Type:: Journal Article
Citation:: Review of Scientific Instruments, 2006, 77 (4)
Issue Date:: 2006-05-15

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Field	Value	Language
dc.contributor.author	Kirkup, L	en_US
dc.contributor.author	Kalceff, W	en_US
dc.contributor.author	McCredie, G	en_US
dc.date.issued	2006-05-15	en_US
dc.identifier.citation	Review of Scientific Instruments, 2006, 77 (4)	en_US
dc.identifier.issn	0034-6748	en_US
dc.identifier.uri	http://hdl.handle.net/10453/744
dc.description.abstract	A versatile system has been developed for the measurement under LABVIEW™ control of junction temperatures in a light emitting diode (LED). Measurements are reported on a commercially available high-intensity InGaAlP LED immersed in liquid nitrogen and driven by currents in the range of 18.5-204 mA. The measured junction temperature has an expanded uncertainty of ±2 K at the 95% level of confidence for temperatures from 70 to 298 K. Using the measured junction temperatures, the junction-to-case thermal resistance of the LED was established as 440 KW for devices with intact encapsulation and 307 KW for partial encapsulation. © 2006 American Institute of Physics.	en_US
dc.relation.ispartof	Review of Scientific Instruments	en_US
dc.relation.isbasedon	10.1063/1.2194482	en_US
dc.subject.classification	Applied Physics	en_US
dc.title	System for measuring the junction temperature of a light emitting diode immersed in liquid nitrogen	en_US
dc.type	Journal Article
utslib.citation.volume	4	en_US
utslib.citation.volume	77	en_US
utslib.for	0299 Other Physical Sciences	en_US
utslib.for	02 Physical Sciences	en_US
utslib.for	03 Chemical Sciences	en_US
utslib.for	09 Engineering	en_US
dc.location.activity	Dalian, China
pubs.embargo.period	Not known	en_US
pubs.organisational-group	/University of Technology Sydney
pubs.organisational-group	/University of Technology Sydney/Faculty of Science
pubs.organisational-group	/University of Technology Sydney/Faculty of Science/School of Mathematical and Physical Sciences
utslib.copyright.status	closed_access
pubs.issue	4	en_US
pubs.publication-status	Published	en_US
pubs.volume	77	en_US

Abstract:

A versatile system has been developed for the measurement under LABVIEW™ control of junction temperatures in a light emitting diode (LED). Measurements are reported on a commercially available high-intensity InGaAlP LED immersed in liquid nitrogen and driven by currents in the range of 18.5-204 mA. The measured junction temperature has an expanded uncertainty of ±2 K at the 95% level of confidence for temperatures from 70 to 298 K. Using the measured junction temperatures, the junction-to-case thermal resistance of the LED was established as 440 KW for devices with intact encapsulation and 307 KW for partial encapsulation. © 2006 American Institute of Physics.

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http://hdl.handle.net/10453/744