Spectral Imaging and X-Ray Microanalysis with Multiple Detectors

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dc.contributor.author Wuhrer, R
dc.contributor.author Moran, K
dc.date.accessioned 2010-06-16T04:57:36Z
dc.date.issued 2007-01
dc.identifier.citation Microscopy & Microanalysis, 2007, 13 (S2), pp. 1350 - 1351
dc.identifier.issn 1431-9276
dc.identifier.other C1UNSUBMIT en_US
dc.identifier.uri http://hdl.handle.net/10453/11783
dc.description.abstract We have progressively refined our requirements for high quality x-ray mapping, which has been a process of learning, advancing our hardware and redefining our requirements. Mapping is not a simple `one size fits all scenario. There are still simple applications where dot mapping, especially with a wavelength dispersive spectrometer, can achieve the required results. The good thing about mapping is that there is always something new that can be learned and we are continually pushing back the boundaries of what can be achieved with mapping. It wont be far into the future that we will have an electron microscope specifically set up to do live x-ray imaging, as we now do for electron imaging. The biggest problem we face is one of being able to determine the level of sophistication in our treatment of the data collected. As with automatic peak identification and standardless analysis it is very easy to produce bad results [1]. The good news is that if you are prepared to set your system up for high quality standards analysis, then most of these problems disappear.
dc.publisher Cambridge University Press
dc.title Spectral Imaging and X-Ray Microanalysis with Multiple Detectors
dc.type Journal Article
dc.parent Microscopy & Microanalysis
dc.journal.volume S2
dc.journal.volume 13
dc.journal.number S2 en_US
dc.publocation UK en_US
dc.identifier.startpage 1350 en_US
dc.identifier.endpage 1351 en_US
dc.cauo.name SCI.Faculty of Science en_US
dc.conference Verified OK en_US
dc.for 0205 Optical Physics
dc.personcode 880536
dc.percentage 100 en_US
dc.classification.name Optical Physics en_US
dc.classification.type FOR-08 en_US
dc.edition en_US
dc.custom en_US
dc.date.activity en_US
dc.location.activity en_US
dc.description.keywords NA en_US
pubs.embargo.period Not known
pubs.organisational-group /University of Technology Sydney
pubs.organisational-group /University of Technology Sydney/Faculty of Science
utslib.copyright.status Open Access
utslib.copyright.date 2015-04-15 12:23:47.074767+10
utslib.collection.history General (ID: 2)

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