Light trapping in translucent samples and its effect on the hemispherical transmittance obtained by an integrating sphere

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dc.contributor.author Jonsson, JC
dc.contributor.author Roos, A
dc.contributor.author Smith, GB
dc.date.accessioned 2009-11-09T02:44:02Z
dc.date.issued 2003
dc.date.issued 2003
dc.identifier.citation Proceedings of SPIE - The International Society for Optical Engineering, 2003, 5192 pp. 91 - 100
dc.identifier.citation Proceedings of SPIE - The International Society for Optical Engineering, 2003, 5192 pp. 91 - 100
dc.identifier.issn 0277-786X
dc.identifier.other E1 en_US
dc.identifier.uri http://hdl.handle.net/10453/1701
dc.description.abstract When a beam of light is incident on a translucent sample, a significant fraction of the light is scattered at high angles. Some of this scattered light may be trapped inside the substrate through multiple reflections and total internal reflection, similar to light coupling into an optical fiber. The trapping depends on factors such as the surface roughness of the external surfaces and/or the size and distribution of scattering particles inside the sample. The scattered light may thus escape out of the sample at a shifted position relative to the incident beam. This leads to port losses in an integrating sphere. The detected signal from the light entering the sphere then underestimates the hemispherical transmittance. In this paper the signal versus lateral position has been measured in an attempt to estimate the error and to find an extrapolation procedure for the correct transmittance value. The lateral measurements were carried out by moving a detector behind the sample, a procedure carried out at several angles of incidence. Different illumination methods have also been studied both theoretically and experimentally to further investigate what effect light trapping can have when characterising scattering samples.
dc.description.abstract When a beam of light is incident on a translucent sample, a significant fraction of the light is scattered at high angles. Some of this scattered light may be trapped inside the substrate through multiple reflections and total internal reflection, similar to light coupling into an optical fiber. The trapping depends on factors such as the surface roughness of the external surfaces and/or the size and distribution of scattering particles inside the sample. The scattered light may thus escape out of the sample at a shifted position relative to the incident beam. This leads to port losses in an integrating sphere. The detected signal from the light entering the sphere then underestimates the hemispherical transmittance. In this paper the signal versus lateral position has been measured in an attempt to estimate the error and to find an extrapolation procedure for the correct transmittance value. The lateral measurements were carried out by moving a detector behind the sample, a procedure carried out at several angles of incidence. Different illumination methods have also been studied both theoretically and experimentally to further investigate what effect light trapping can have when characterising scattering samples.
dc.relation.isbasedon 10.1117/12.508196
dc.title Light trapping in translucent samples and its effect on the hemispherical transmittance obtained by an integrating sphere
dc.type Conference Proceeding
dc.description.version Published
dc.parent Proceedings of SPIE - The International Society for Optical Engineering
dc.parent Proceedings of SPIE - The International Society for Optical Engineering
dc.journal.volume 5192
dc.journal.number en_US
dc.publocation Washington, USA en_US
dc.publocation Brisbane, Australia
dc.identifier.startpage 91 en_US
dc.identifier.endpage 100 en_US
dc.cauo.name SCI.Physics and Advanced Materials en_US
dc.conference Verified OK en_US
dc.conference Asia Pacific Vibration Conference
dc.conference Conference on Diagnostic Methods for Inorganic Materials III
dc.conference.location San Diego CA, USA en_US
dc.for 1007 Nanotechnology
dc.for 0912 Materials Engineering
dc.for 0205 Optical Physics
dc.personcode 730312
dc.percentage 60 en_US
dc.classification.name Optical Physics en_US
dc.classification.type FOR-08 en_US
dc.custom Optical Diagnostic Methods for Inorganic Materials III en_US
dc.date.activity 20030806 en_US
dc.date.activity 2003-11-12
dc.date.activity 2003-08-06
dc.location.activity San Diego CA, USA en_US
dc.location.activity Gold Coast, Queensland, Australia
dc.location.activity SAN DIEGO, CA
dc.description.keywords Hemispherical transmittance
dc.description.keywords Hemispherical transmittance
dc.description.keywords Integrating spheres
dc.description.keywords Integrating spheres
dc.description.keywords Light scattering
dc.description.keywords Light scattering
dc.description.keywords Optical trapping
dc.description.keywords Optical trapping
pubs.embargo.period Not known
pubs.organisational-group /University of Technology Sydney
pubs.organisational-group /University of Technology Sydney/Faculty of Science
pubs.organisational-group /University of Technology Sydney/Strength - Materials and Technology for Energy Efficiency
pubs.organisational-group /University of Technology Sydney/Strength - Materials and Technology for Energy Efficiency
utslib.copyright.status Open Access
utslib.copyright.date 2015-04-15 12:23:47.074767+10
pubs.consider-herdc true
utslib.collection.history School of Physics and Advanced Materials (ID: 343)
utslib.collection.history General Collection (ID: 346) [2015-05-15T14:12:00+10:00]
utslib.collection.history School of Physics and Advanced Materials (ID: 343)
utslib.collection.history General (ID: 2)
utslib.collection.history General (ID: 2)


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