Imaging deep trap distributions by low vacuum scanning electron microscopy

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dc.contributor.author Toth, M
dc.contributor.author Knowles, WR
dc.contributor.author Phillips, MR
dc.date.accessioned 2009-11-12T04:40:55Z
dc.date.issued 2007-02-12
dc.identifier.citation APPLIED PHYSICS LETTERS, 2007, 90 (7), pp. ? - ? (3)
dc.identifier.issn 0003-6951
dc.identifier.other C1 en_US
dc.identifier.uri http://hdl.handle.net/10453/3206
dc.language English
dc.publisher AMER INST PHYSICS
dc.relation.isbasedon 10.1063/1.2644159
dc.subject Science & Technology, Physical Sciences, Physics, Applied, Physics, PHYSICS, APPLIED, PHONON EMISSION, INSULATORS, SEMICONDUCTORS, IONIZATION, SIO2, CATHODOLUMINESCENCE, IRRADIATION, SCATTERING, TRANSPORT, ENERGIES, Phonon Emission, Insulators, Semiconductors, Ionization, Sio2, Cathodoluminescence, Irradiation, Scattering, Transport, Energies, Applied Physics
dc.subject Science & Technology; Physical Sciences; Physics, Applied; Physics; PHYSICS, APPLIED; PHONON EMISSION; INSULATORS; SEMICONDUCTORS; IONIZATION; SIO2; CATHODOLUMINESCENCE; IRRADIATION; SCATTERING; TRANSPORT; ENERGIES; Phonon Emission; Insulators; Semiconductors; Ionization; Sio2; Cathodoluminescence; Irradiation; Scattering; Transport; Energies; Applied Physics
dc.title Imaging deep trap distributions by low vacuum scanning electron microscopy
dc.type Journal Article
dc.description.version Published
dc.parent APPLIED PHYSICS LETTERS
dc.journal.volume 7
dc.journal.volume 90
dc.journal.number 7 en_US
dc.publocation Melville en_US
dc.identifier.startpage 0 en_US
dc.identifier.endpage 0 en_US
dc.cauo.name SCI.Physics and Advanced Materials en_US
dc.conference Verified OK en_US
dc.for 0204 Condensed Matter Physics
dc.personcode 112289 en_US
dc.personcode 0000022102 en_US
dc.personcode 810070 en_US
dc.percentage 100 en_US
dc.classification.name Condensed Matter Physics en_US
dc.classification.type FOR-08 en_US
dc.location.activity ISI:000244249800052 en_US
dc.description.keywords Phonon Emission; Insulators; Semiconductors; Ionization; Sio2; Cathodoluminescence; Irradiation; Scattering; Transport; Energies en_US
dc.description.keywords Science & Technology
dc.description.keywords Physical Sciences
dc.description.keywords Physics, Applied
dc.description.keywords Physics
dc.description.keywords PHYSICS, APPLIED
dc.description.keywords PHONON EMISSION
dc.description.keywords INSULATORS
dc.description.keywords SEMICONDUCTORS
dc.description.keywords IONIZATION
dc.description.keywords SIO2
dc.description.keywords CATHODOLUMINESCENCE
dc.description.keywords IRRADIATION
dc.description.keywords SCATTERING
dc.description.keywords TRANSPORT
dc.description.keywords ENERGIES
dc.staffid 810070 en_US
pubs.embargo.period Not known
pubs.organisational-group /University of Technology Sydney
pubs.organisational-group /University of Technology Sydney/Faculty of Science
pubs.organisational-group /University of Technology Sydney/Faculty of Science/School of Physics and Advanced Materials
pubs.organisational-group /University of Technology Sydney/Strength - Materials and Technology for Energy Efficiency


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