Analysis of diffraction gratings by using an edge element method

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dc.contributor.author Dossou, KB
dc.contributor.author Packirisamy, M
dc.contributor.author Fontaine, M
dc.date.accessioned 2009-11-12T05:28:28Z
dc.date.issued 2005-01
dc.identifier.citation Journal of the Optical Society of America A: Optics Image Science and Vision, 2005, 22 (2), pp. 278 - 288
dc.identifier.issn 1084-7529
dc.identifier.other C1 en_US
dc.identifier.uri http://hdl.handle.net/10453/3270
dc.description.abstract Typically the grating problem is formulated for TE and TM polirizations by using, respectively, the electric and magnetic fields aligned with the grating wall and perpendicular to the plane of incidence, and this leads to a one-field-component problem. For some grating profiles such as metallic gratings with a traingular profile, the prediction of TM polarisation by using a standard finite-element method experiences a slower convergence rate, and this reduces the accuracy of the computed results and also introduces a numerical polarisation effect. This discrepency cannot be seen as a simple numerical issue, since it has been observed for different types of numerical methods based o the classical formulation. Hence an alternative formulation is proposed, where the grating problem is modeled by taking the electric field as unknown for TM polarisation. The application of this idea to both TE and TM polarisation leads to a two-field component problem. The purpose of the paper is to propose an edge finite-element method to solve this wave problem. A comparison of the results of the proposed formulation and the classical formulation shows improvement and robustness in the new approach.
dc.publisher Optical Society of America
dc.relation.isbasedon 10.1364/JOSAA.22.000278
dc.title Analysis of diffraction gratings by using an edge element method
dc.type Journal Article
dc.parent Journal of the Optical Society of America A: Optics Image Science and Vision
dc.journal.volume 2
dc.journal.volume 22
dc.journal.number 2 en_US
dc.publocation USA en_US
dc.identifier.startpage 278 en_US
dc.identifier.endpage 288 en_US
dc.cauo.name FEIT.School of Elec, Mech and Mechatronic Systems en_US
dc.conference Verified OK en_US
dc.for 0205 Optical Physics
dc.personcode 040396
dc.percentage 100 en_US
dc.classification.name Optical Physics en_US
dc.classification.type FOR-08 en_US
pubs.embargo.period Not known
pubs.organisational-group /University of Technology Sydney
pubs.organisational-group /University of Technology Sydney/Faculty of Science
utslib.copyright.status Open Access
utslib.copyright.date 2015-04-15 12:23:47.074767+10
utslib.copyright.date 2015-04-15 12:23:47.074767+10
pubs.consider-herdc true
pubs.consider-herdc true
utslib.collection.history School of Mathematical Sciences (ID: 340)
utslib.collection.history School of Mathematical Sciences (ID: 340)
utslib.collection.history General (ID: 2)
utslib.collection.history General (ID: 2)


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