Electron beam current loss at the high-vacuum-high-pressure boundary in the environmental scanning electron microscope

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dc.contributor.author Danilatos, GD
dc.contributor.author Phillips, MR
dc.contributor.author Nailon, JV
dc.date.accessioned 2009-11-12T05:29:02Z
dc.date.issued 2001-09-01
dc.identifier.citation MICROSCOPY AND MICROANALYSIS, 2001, 7 (5), pp. 397 - 406 (10)
dc.identifier.issn 1431-9276
dc.identifier.other C1 en_US
dc.identifier.uri http://hdl.handle.net/10453/3276
dc.language English
dc.publisher SPRINGER-VERLAG
dc.subject Science & Technology, Technology, Materials Science, Multidisciplinary, Microscopy, Materials Science, MATERIALS SCIENCE, MULTIDISCIPLINARY, MICROSCOPY, environmental scanning electron microscope, electron scattering, electron loss, differential pumping, gas jet, pressure limiting aperture, image noise, electron skirt, CONSTRUCTION, DESIGN, SEM, environmental scanning electron microscope, electron scattering, electron loss, differential pumping, gas jet, pressure limiting aperture, image noise, electron skirt, Microscopy
dc.subject Science & Technology; Technology; Materials Science, Multidisciplinary; Microscopy; Materials Science; MATERIALS SCIENCE, MULTIDISCIPLINARY; MICROSCOPY; environmental scanning electron microscope; electron scattering; electron loss; differential pumping; gas jet; pressure limiting aperture; image noise; electron skirt; CONSTRUCTION; DESIGN; SEM; environmental scanning electron microscope; electron scattering; electron loss; differential pumping; gas jet; pressure limiting aperture; image noise; electron skirt; Microscopy
dc.title Electron beam current loss at the high-vacuum-high-pressure boundary in the environmental scanning electron microscope
dc.type Journal Article
dc.description.version Published
dc.parent MICROSCOPY AND MICROANALYSIS
dc.journal.volume 5
dc.journal.volume 7
dc.journal.number 5 en_US
dc.publocation New York, USA en_US
dc.identifier.startpage 397 en_US
dc.identifier.endpage 406 en_US
dc.cauo.name SCI.Physics and Advanced Materials en_US
dc.conference Verified OK en_US
dc.for 0912 Materials Engineering
dc.for 0204 Condensed Matter Physics
dc.personcode 0000024177 en_US
dc.personcode 810070 en_US
dc.personcode 0000024178 en_US
dc.percentage 80 en_US
dc.classification.name Condensed Matter Physics en_US
dc.classification.type FOR-08 en_US
dc.description.keywords Science & Technology
dc.description.keywords Technology
dc.description.keywords Materials Science, Multidisciplinary
dc.description.keywords Microscopy
dc.description.keywords Materials Science
dc.description.keywords MATERIALS SCIENCE, MULTIDISCIPLINARY
dc.description.keywords MICROSCOPY
dc.description.keywords environmental scanning electron microscope
dc.description.keywords electron scattering
dc.description.keywords electron loss
dc.description.keywords differential pumping
dc.description.keywords gas jet
dc.description.keywords pressure limiting aperture
dc.description.keywords image noise
dc.description.keywords electron skirt
dc.description.keywords CONSTRUCTION
dc.description.keywords DESIGN
dc.description.keywords SEM
pubs.embargo.period Not known
pubs.organisational-group /University of Technology Sydney
pubs.organisational-group /University of Technology Sydney/Faculty of Science
pubs.organisational-group /University of Technology Sydney/Strength - Materials and Technology for Energy Efficiency


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