Multiresolution Analysis for Reconstruction of Conductivity Profiles in Eddy Current Non-Destructive Evaluation Using Probe Impedance Data

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dc.contributor.author Shao, KR
dc.contributor.author Guo, Y
dc.contributor.author Lavers, JD
dc.date.accessioned 2009-12-21T03:51:02Z
dc.date.issued 2004-01
dc.identifier.citation IEEE Transactions on Magnetics, 2004, 40 (4), pp. 2101 - 2103
dc.identifier.issn 0018-9464
dc.identifier.other C1 en_US
dc.identifier.uri http://hdl.handle.net/10453/5665
dc.publisher IEEE Magnetics Society
dc.relation.hasversion Accepted manuscript version en_US
dc.relation.isbasedon 10.1109/TMAG.2004.832264
dc.title Multiresolution Analysis for Reconstruction of Conductivity Profiles in Eddy Current Non-Destructive Evaluation Using Probe Impedance Data
dc.type Journal Article
dc.parent IEEE Transactions on Magnetics
dc.journal.volume 4
dc.journal.volume 40
dc.journal.number 4 en_US
dc.publocation Piscataway, NY, USA en_US
dc.identifier.startpage 2101 en_US
dc.identifier.endpage 2103 en_US
dc.cauo.name FEIT.School of Elec, Mech and Mechatronic Systems en_US
dc.conference Verified OK en_US
dc.for 0906 Electrical and Electronic Engineering
dc.personcode 990817
dc.percentage 100 en_US
dc.classification.name Electrical and Electronic Engineering en_US
dc.classification.type FOR-08 en_US
pubs.embargo.period Not known
pubs.organisational-group /University of Technology Sydney
pubs.organisational-group /University of Technology Sydney/Faculty of Engineering and Information Technology
pubs.organisational-group /University of Technology Sydney/Faculty of Engineering and Information Technology/School of Elec, Mech and Mechatronic Systems


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