Characterisation of materials through x-ray mapping

DSpace/Manakin Repository

Search OPUS

Advanced Search


My Account

Show simple item record Wuhrer, R Moran, K Moran, L 2009-12-21T03:51:18Z 2006-01
dc.identifier.citation Materials Forum, 2006, 30 pp. 63 - 70
dc.identifier.issn 1447-6738
dc.identifier.other C1 en_US
dc.description.abstract Scanning electron microscopy (SEM) energy dispersive spectroscopy (EDS, wavelength dispersive spectroscopy (WDS) and the conbination of these techniques through x-ray mapping (XRM) have become excellent tool for characterising the distribution of elements and phases in materials. Quantitative x-ray mapping (QXRM) enables reliable quantitative results that cna be an order of magnitude better than traditional analysis and is also far superior to regions of interest x-ray maps(ROIM) where low levels of an element overlaps are present.
dc.publisher Intsitute of Materials Engineering Australiasia
dc.title Characterisation of materials through x-ray mapping
dc.type Journal Article
dc.parent Materials Forum
dc.journal.volume 30
dc.journal.number en_US
dc.publocation North Melbourne, VIC Australia en_US
dc.identifier.startpage 63 en_US
dc.identifier.endpage 70 en_US INT en_US
dc.conference Verified OK en_US
dc.for 0299 Other Physical Sciences
dc.for 1007 Nanotechnology
dc.for 0912 Materials Engineering
dc.personcode 880536
dc.percentage 60 en_US Materials Engineering en_US
dc.classification.type FOR-08 en_US
dc.location.activity UTS Gallery, Sydney
dc.description.keywords x-ray mapping, pseudo colouring, quantitative analysis en_US
dc.description.keywords design, safety, security, object
pubs.embargo.period Not known
pubs.organisational-group /University of Technology Sydney
pubs.organisational-group /University of Technology Sydney/Faculty of Science
utslib.copyright.status Open Access 2015-04-15 12:23:47.074767+10
utslib.collection.history General (ID: 2)

Files in this item

This item appears in the following Collection(s)

Show simple item record