Implications of polishing techniques in quantitative X-ray microanalysis

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dc.contributor.author Remond, G
dc.contributor.author Nockolds, C
dc.contributor.author Phillips, M
dc.contributor.author Roques-Carmes, C
dc.date.accessioned 2009-12-21T03:53:20Z
dc.date.issued 2002-01
dc.identifier.citation Journal of Research of the national Institute of Standards and technology, 2002, 107 (6), pp. 639 - 662
dc.identifier.issn 1044-677X
dc.identifier.other C1 en_US
dc.identifier.uri http://hdl.handle.net/10453/5865
dc.publisher US Govt. Printing Office
dc.relation.isbasedon 10.6028/jres.107.052
dc.title Implications of polishing techniques in quantitative X-ray microanalysis
dc.type Journal Article
dc.parent Journal of Research of the national Institute of Standards and technology
dc.journal.volume 6
dc.journal.volume 107
dc.journal.number 6 en_US
dc.publocation Washington DC en_US
dc.identifier.startpage 639 en_US
dc.identifier.endpage 662 en_US
dc.cauo.name SCI.Faculty of Science en_US
dc.conference Verified OK en_US
dc.for 0912 Materials Engineering
dc.for 0204 Condensed Matter Physics
dc.personcode 810070
dc.percentage 80 en_US
dc.classification.name Condensed Matter Physics en_US
dc.classification.type FOR-08 en_US
pubs.embargo.period Not known
pubs.organisational-group /University of Technology Sydney
pubs.organisational-group /University of Technology Sydney/Faculty of Science
pubs.organisational-group /University of Technology Sydney/Strength - Materials and Technology for Energy Efficiency
utslib.copyright.status Open Access
utslib.copyright.date 2015-04-15 12:23:47.074767+10
utslib.copyright.date 2015-04-15 12:23:47.074767+10
pubs.consider-herdc true
pubs.consider-herdc true
utslib.collection.history General (ID: 2)


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