Conduction, storage, and leakage in particle-on-SAM nanocapacitors

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dc.contributor.author Cortie, MB
dc.contributor.author Zareie, MH
dc.contributor.author Ekanayake, SR
dc.contributor.author Ford, MJ
dc.date.accessioned 2009-12-21T03:53:21Z
dc.date.issued 2005-07
dc.identifier.citation IEEE Transactions on Nanotechnology, 2005, 4 (4), pp. 406 - 413
dc.identifier.issn 1536-125X
dc.identifier.other C1 en_US
dc.identifier.uri http://hdl.handle.net/10453/5867
dc.description.abstract Individual gold nanoparticles exhibit discrete capacitances of the order of 1 aF, and they can be tethered to a conductive substrate using a bi-functional monolayer of a suitable organic molecule. However the conduction, retention and leakage of charge by such an attached "nanocapacitor" will be an important issue in any practical application of this concept. Here we investigate the electrical properties of the particles using a combination of scanning tunneling spectroscopy and numerical modeling based on equalizing Wentzel-Kramers-Brillouin style tunneling currents. Application of the model provides the voltage division across the structure, and, together, with an estimate of the capacitance of the particle, provides an indication of likely stored charge and energy and its decay. The methodology was tested with I-V data measured for an Au{111}-α, α'-p-xylyldithiol-Au nanoparticle system in air. About 25 eV can be stored on the nanoparticles using a charging voltage of 3 V, corresponding to up to twenty electrons. However, leakage of the charge will occur by tunneling in approximately 6×10-9 s. Therefore, these nanocapacitors would discharge completely in any electric circuit slower than about 1.5 GHz. © 2005 IEEE.
dc.language eng
dc.relation.hasversion Accepted manuscript version en_US
dc.relation.isbasedon 10.1109/TNANO.2005.851286
dc.title Conduction, storage, and leakage in particle-on-SAM nanocapacitors
dc.type Journal Article
dc.parent IEEE Transactions on Nanotechnology
dc.journal.volume 4
dc.journal.volume 4
dc.journal.number 4 en_US
dc.publocation Piscataway, USA en_US
dc.publocation Auckland
dc.identifier.startpage 406 en_US
dc.identifier.endpage 414 en_US
dc.cauo.name INT en_US
dc.conference Verified OK en_US
dc.conference Australian and New Zealand Marketing Academy Conference
dc.for 0303 Macromolecular and Materials Chemistry
dc.personcode 020302
dc.personcode 020323
dc.personcode 030414
dc.personcode 014903
dc.percentage 100 en_US
dc.classification.name Macromolecular and Materials Chemistry en_US
dc.classification.type FOR-08 en_US
dc.custom 3.176 en_US
dc.date.activity 2001-12-01
dc.location.activity Auckland
dc.description.keywords Capacitance
dc.description.keywords Dielectric films
dc.description.keywords Leakage currents
dc.description.keywords Nanotechnology
pubs.embargo.period Not known
pubs.organisational-group /University of Technology Sydney
pubs.organisational-group /University of Technology Sydney/Faculty of Engineering and Information Technology
pubs.organisational-group /University of Technology Sydney/Faculty of Science
pubs.organisational-group /University of Technology Sydney/Strength - Materials and Technology for Energy Efficiency
utslib.copyright.status Open Access
utslib.copyright.date 2015-04-15 12:23:47.074767+10
pubs.consider-herdc true
utslib.collection.history School of Physics and Advanced Materials (ID: 343)
utslib.collection.history School of Physics and Advanced Materials (ID: 343)
utslib.collection.history General (ID: 2)


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