Enhanced high speed SE imaging using a VPSEM using a Frisch Grid

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dc.contributor.author Phillips, M
dc.contributor.author Morgan, SW
dc.contributor.editor Kotula, P
dc.contributor.editor marko, M
dc.contributor.editor Scott, JH
dc.contributor.editor gauvin, R
dc.contributor.editor Beniac, D
dc.contributor.editor Lucas, G
dc.contributor.editor McKernan, S
dc.contributor.editor Shields, J
dc.date.accessioned 2009-06-26T04:12:53Z
dc.date.issued 2006-01
dc.identifier.citation Proceedings of Microscopy & Microanalysis 12, Suppl. 2 2006, 2006, pp. 1480 - 1481
dc.identifier.issn 1431-9276
dc.identifier.other E1 en_US
dc.identifier.uri http://hdl.handle.net/10453/707
dc.description.abstract Secondary electron (SE) imaging in a variable pressure SEM has necessitated the development of new detector technologies. One approach is to measure the charge, Q, induced on a positive electrode placed at some distance, r, from the specimen stage which is a ground potential. Gas ionization by sufficiently energetic SEs produces electron-ion pairs which are charge separated by the applied electric field. Electrons drift towards the anode causing further gas ionization in a cascade process, and the ions drift towards the stage (cathode). The total Q induced at the anode will include charge components induced by the motion of both electrons, QE, and ions, QI.
dc.publisher Cambridge university Press
dc.relation.isbasedon 10.1017/S1431927606069522
dc.subject Microscopy
dc.subject Microscopy
dc.title Enhanced high speed SE imaging using a VPSEM using a Frisch Grid
dc.type Conference Proceeding
dc.parent Proceedings of Microscopy & Microanalysis 12, Suppl. 2 2006
dc.publocation USA en_US
dc.publocation USA
dc.identifier.startpage 1480 en_US
dc.identifier.endpage 1481 en_US
dc.cauo.name SCI.Physics and Advanced Materials en_US
dc.conference Verified OK en_US
dc.conference Microscopy & Microanalysis
dc.for 029904 Synchrotrons; Accelerators; Instruments and Techniques
dc.personcode 810070 en_US
dc.personcode 96088947 en_US
dc.percentage 100 en_US
dc.classification.name Synchrotrons; Accelerators; Instruments and Techniques en_US
dc.classification.type FOR-08 en_US
dc.custom Microscopy & Microanalysis en_US
dc.date.activity 20060730 en_US
dc.date.activity 2006-07-30
dc.location.activity Chicago, USA en_US
dc.location.activity Chicago, USA
dc.staffid 040207 en_US
pubs.embargo.period Not known
pubs.organisational-group /University of Technology Sydney
pubs.organisational-group /University of Technology Sydney/Faculty of Science
pubs.organisational-group /University of Technology Sydney/Strength - Materials and Technology for Energy Efficiency

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