X-ray spectrometry investigation of electrical isolation in GaN

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dc.contributor.author Kucheyev, SO
dc.contributor.author Toth, M
dc.contributor.author Phillips, MR
dc.contributor.author Williams, JS
dc.contributor.author Jagadish, C
dc.contributor.author Li, G
dc.date.accessioned 2009-06-26T04:12:55Z
dc.date.issued 2002-03-15
dc.identifier.citation JOURNAL OF APPLIED PHYSICS, 2002, 91 (6), pp. 3940 - 3942
dc.identifier.issn 0021-8979
dc.identifier.other C1 en_US
dc.identifier.uri http://hdl.handle.net/10453/719
dc.relation.isbasedon 10.1063/1.1452759
dc.title X-ray spectrometry investigation of electrical isolation in GaN
dc.type Journal Article
dc.description.version Published
dc.description.version Published
dc.parent JOURNAL OF APPLIED PHYSICS
dc.journal.volume 6
dc.journal.volume 91
dc.journal.number 6 en_US
dc.publocation New York, USA en_US
dc.identifier.startpage 3940 en_US
dc.identifier.endpage 3942 en_US
dc.cauo.name SCI.Faculty of Science en_US
dc.conference Verified OK en_US
dc.for 0912 Materials Engineering
dc.for 0204 Condensed Matter Physics
dc.personcode 810070
dc.personcode 112289
dc.percentage 80 en_US
dc.classification.name Condensed Matter Physics en_US
dc.classification.type FOR-08 en_US
pubs.embargo.period Not known
pubs.organisational-group /University of Technology Sydney
pubs.organisational-group /University of Technology Sydney/Faculty of Science
pubs.organisational-group /University of Technology Sydney/Strength - Materials and Technology for Energy Efficiency
utslib.copyright.status Closed Access
utslib.copyright.date 2015-04-15 12:17:09.805752+10
pubs.consider-herdc true
utslib.collection.history Closed (ID: 3)


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