Electron imaging of dielectrics under simultaneous electron-ion irradiation

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dc.contributor.author Toth, M
dc.contributor.author Phillips, MR
dc.contributor.author Thiel, BL
dc.contributor.author Donald, AM
dc.date.accessioned 2009-06-26T04:12:56Z
dc.date.issued 2002-04-01
dc.identifier.citation JOURNAL OF APPLIED PHYSICS, 2002, 91 (7), pp. 4479 - 4491
dc.identifier.issn 0021-8979
dc.identifier.other C1 en_US
dc.identifier.uri http://hdl.handle.net/10453/742
dc.relation.isbasedon 10.1063/1.1448875
dc.title Electron imaging of dielectrics under simultaneous electron-ion irradiation
dc.type Journal Article
dc.description.version Published
dc.description.version Published
dc.parent JOURNAL OF APPLIED PHYSICS
dc.journal.volume 7
dc.journal.volume 91
dc.journal.number 7 en_US
dc.publocation New York, USA en_US
dc.identifier.startpage 4479 en_US
dc.identifier.endpage 4491 en_US
dc.cauo.name SCI.Faculty of Science en_US
dc.conference Verified OK en_US
dc.for 0912 Materials Engineering
dc.for 0204 Condensed Matter Physics
dc.personcode 810070
dc.personcode 112289
dc.percentage 80 en_US
dc.classification.name Condensed Matter Physics en_US
dc.classification.type FOR-08 en_US
pubs.embargo.period Not known
pubs.organisational-group /University of Technology Sydney
pubs.organisational-group /University of Technology Sydney/Faculty of Science
pubs.organisational-group /University of Technology Sydney/Strength - Materials and Technology for Energy Efficiency
utslib.copyright.status Closed Access
utslib.copyright.date 2015-04-15 12:23:47.074767+10
pubs.consider-herdc true
utslib.collection.history General Collection (ID: 346) [2015-05-15T14:11:23+10:00]
utslib.collection.history School of Physics and Advanced Materials (ID: 343)
utslib.collection.history General (ID: 2)
utslib.collection.history School of Physics and Advanced Materials (ID: 343)


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