The 1s-state analysis applied to high angle annular dark field image interpretation - when can we use it?

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dc.contributor.author Anstis, G
dc.date.accessioned 2009-06-26T04:12:57Z
dc.date.issued 2004-01
dc.identifier.citation Microscopy & Microanalysis, 2004, 10 (1), pp. 4 - 8
dc.identifier.issn 1431-9276
dc.identifier.other C1 en_US
dc.identifier.uri http://hdl.handle.net/10453/755
dc.description.abstract A small probe centered on an atomic column excites the bound and unbound states of the two-dimensional projected potential of the column. It has been argued that, even when several states are excited, only the 1s state is sufficiently localized to contribute a signal to the high-angle detector. This article shows that non-1s states do make a significant contribution for certain incident probe profiles. The contribution of the 1s state to the thermal diffuse scattering is calculated directly. Sub-Ångstrom probes formed by Cs-corrected lenses excite predominantly the 1s state and contributions from other states are not very large. For probes of lower resolution when non-1s states are important, the integrated electron intensity at the column provides a better estimate of image intensity.
dc.publisher Cambridge University Press
dc.relation.isbasedon 10.1017/s1431927604040255
dc.title The 1s-state analysis applied to high angle annular dark field image interpretation - when can we use it?
dc.type Journal Article
dc.parent Microscopy & Microanalysis
dc.journal.volume 1
dc.journal.volume 10
dc.journal.number 1 en_US
dc.publocation New York, USA en_US
dc.identifier.startpage 4 en_US
dc.identifier.endpage 8 en_US
dc.cauo.name SCI.Physics and Advanced Materials en_US
dc.conference Verified OK en_US
dc.for 0205 Optical Physics
dc.personcode 840027
dc.percentage 100 en_US
dc.classification.name Optical Physics en_US
dc.classification.type FOR-08 en_US
dc.description.keywords High resolution electron microscopy, scanning transission electron microscopy, high-angle annular dark-field imaging, 1s state, termal diffuse scattering, multislice metod, frozen phonon
dc.description.keywords High resolution electron microscopy, scanning transission electron microscopy, high-angle annular dark-field imaging, 1s state, termal diffuse scattering, multislice metod, frozen phonon
pubs.embargo.period Not known
pubs.organisational-group /University of Technology Sydney
pubs.organisational-group /University of Technology Sydney/Faculty of Science
utslib.copyright.status Open Access
utslib.copyright.date 2015-04-15 12:23:47.074767+10
utslib.copyright.date 2015-04-15 12:23:47.074767+10
pubs.consider-herdc true
pubs.consider-herdc true
utslib.collection.history General (ID: 2)
utslib.collection.history General Collection (ID: 346) [2015-05-15T14:11:24+10:00]


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