Third harmonics due to surface barrier in high-temperature superconductor

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dc.contributor.author Xu, XB
dc.contributor.author Zhang, L
dc.contributor.author Leng, X
dc.contributor.author Ding, SY
dc.contributor.author Liu, HK
dc.contributor.author Wang, XL
dc.contributor.author Dou, SX
dc.contributor.author Lin, ZW
dc.contributor.author Zhu, JG
dc.date.accessioned 2009-06-26T04:12:58Z
dc.date.issued 2005-05-15
dc.identifier.citation Journal of Applied Physics, 2005, 97 (10)
dc.identifier.issn 0021-8979
dc.identifier.other C1 en_US
dc.identifier.uri http://hdl.handle.net/10453/768
dc.description.abstract The influence of surface barrier on the third harmonics ac susceptibility (χ3) is studied numerically. The surface barrier is described by a critical current density in surfaces which are higher than the inside one. The model can act as the critical state one, the flux creep one, or the flux flow one when temperature (or field) changes. The numerical results based on the model are more close to the popular experimental data probing the harmonics as a function of temperature (or field). Besides, the surface barrier will lead to new peaks in the real and imaginary parts of the third harmonics, which are the finger signature of the surface barrier. Comparison of the peaks with those of the real part of elemental harmonic shows that they are located at the same temperature where dips in χ′ caused by the surface barrier occur, which is in well agreement with experiments. © 2005 American Institute of Physics.
dc.language eng
dc.relation.isbasedon 10.1063/1.1851413
dc.subject Modified Bean Model, Ii Superconductors, Flux-Creep, Magnetic-Relaxation, Ac Susceptibilities, Critical-State, Vortex Matter, Bi2Sr2Cacu2O8, Generation, Transport, Applied Physics
dc.subject Modified Bean Model; Ii Superconductors; Flux-Creep; Magnetic-Relaxation; Ac Susceptibilities; Critical-State; Vortex Matter; Bi2Sr2Cacu2O8; Generation; Transport; Applied Physics
dc.title Third harmonics due to surface barrier in high-temperature superconductor
dc.type Journal Article
dc.parent Journal of Applied Physics
dc.journal.volume 10
dc.journal.volume 97
dc.journal.number 10 en_US
dc.publocation Melville, USA en_US
dc.identifier.startpage 1 en_US
dc.identifier.endpage 3 en_US
dc.cauo.name FEIT.School of Elec, Mech and Mechatronic Systems en_US
dc.conference Verified OK en_US
dc.for 0912 Materials Engineering
dc.personcode 0000025015 en_US
dc.personcode 0000024580 en_US
dc.personcode 0000024581 en_US
dc.personcode 0000024582 en_US
dc.personcode 0000024583 en_US
dc.personcode 0000024017 en_US
dc.personcode 0000024584 en_US
dc.personcode 020518 en_US
dc.personcode 910870 en_US
dc.percentage 100 en_US
dc.classification.name Materials Engineering en_US
dc.classification.type FOR-08 en_US
dc.custom 2.255 en_US
dc.location.activity ISI:000258582100014
dc.description.keywords Modified Bean Model; Ii Superconductors; Flux-Creep; Magnetic-Relaxation; Ac Susceptibilities; Critical-State; Vortex Matter; Bi2Sr2Cacu2O8; Generation; Transport en_US
dc.description.keywords Of-Life
dc.description.keywords Psychosocial Consequences
dc.description.keywords Emotional-Reactions
dc.description.keywords Peer Victimization
dc.description.keywords Psoriasis Patients
dc.description.keywords Body-Image
dc.description.keywords Follow-Up
dc.description.keywords Childhood
dc.description.keywords Impact
dc.description.keywords Sample
dc.description.keywords Modified Bean Model
dc.description.keywords Ii Superconductors
dc.description.keywords Flux-Creep
dc.description.keywords Magnetic-Relaxation
dc.description.keywords Ac Susceptibilities
dc.description.keywords Critical-State
dc.description.keywords Vortex Matter
dc.description.keywords Bi2Sr2Cacu2O8
dc.description.keywords Generation
dc.description.keywords Transport
dc.staffid 910870 en_US
pubs.embargo.period Not known
pubs.organisational-group /University of Technology Sydney
pubs.organisational-group /University of Technology Sydney/Faculty of Engineering and Information Technology
pubs.organisational-group /University of Technology Sydney/Faculty of Engineering and Information Technology/School of Elec, Mech and Mechatronic Systems


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