X-ray mapping using a multiple-EDS (DUAL) detectors

DSpace/Manakin Repository

Search OPUS


Advanced Search

Browse

My Account

Show simple item record

dc.contributor.author Wuhrer, R
dc.contributor.author Moran, K
dc.contributor.author Phillips, MR
dc.contributor.author Davey, P
dc.date.accessioned 2009-06-26T04:12:59Z
dc.date.issued 2006-08
dc.identifier.citation Microscopy and Microanalysis, 2006, 12 (SUPPL. 2), pp. 1406 - 1407
dc.identifier.issn 1431-9276
dc.identifier.other E1 en_US
dc.identifier.uri http://hdl.handle.net/10453/775
dc.relation.isbasedon 10.1017/S143192760606243X
dc.title X-ray mapping using a multiple-EDS (DUAL) detectors
dc.type Conference Proceeding
dc.parent Microscopy and Microanalysis
dc.journal.volume SUPPL. 2
dc.journal.volume 12
dc.publocation USA en_US
dc.identifier.startpage 1406 en_US
dc.identifier.endpage 1407 en_US
dc.cauo.name SCI.Physics and Advanced Materials en_US
dc.conference Verified OK en_US
dc.conference Microscopy & Microanalysis
dc.for 0299 Other Physical Sciences
dc.for 1007 Nanotechnology
dc.for 029904 Synchrotrons; Accelerators; Instruments and Techniques
dc.personcode 810070
dc.personcode 880536
dc.percentage 60 en_US
dc.classification.name Synchrotrons; Accelerators; Instruments and Techniques en_US
dc.classification.type FOR-08 en_US
dc.custom Microscopy & Microanalysis en_US
dc.date.activity 20060730 en_US
dc.date.activity 2006-07-30
dc.location.activity Chicago USA en_US
pubs.embargo.period Not known
pubs.organisational-group /University of Technology Sydney
pubs.organisational-group /University of Technology Sydney/Faculty of Science
pubs.organisational-group /University of Technology Sydney/Strength - Materials and Technology for Energy Efficiency
utslib.copyright.status Open Access
utslib.copyright.date 2015-04-15 12:23:47.074767+10


Files in this item

This item appears in the following Collection(s)

Show simple item record