X-ray mapping using a multiple-EDS (DUAL) detector

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dc.contributor.author Wuhrer, R
dc.contributor.author Moran, K
dc.contributor.author Phillips, M
dc.contributor.author Davey, P
dc.contributor.editor Kotula, P
dc.contributor.editor Marko, M
dc.contributor.editor Scott, JH
dc.contributor.editor Gauvin, R
dc.contributor.editor Beniac, D
dc.contributor.editor Lucas, G
dc.contributor.editor McKernan, S
dc.contributor.editor Shields, J
dc.date.accessioned 2009-06-26T04:12:59Z
dc.date.issued 2006-01
dc.identifier.citation Proceedings of Microscopy & Microanalysis 12, suppl. 2, 2006, 2006, pp. 1406 - 1407
dc.identifier.issn 1431-9276
dc.identifier.other E1 en_US
dc.identifier.uri http://hdl.handle.net/10453/775
dc.description.abstract X-ray mapping (XRM) is an extremely useful problem solving tool. However, the two major problems for energy dispersive spectroscopy are interpretation of results under non ideal conditions (strong overlap and small peak size relative to background), and the time required to obtain a good quality 256x256 pixel map (1 to 3 hours). XRM has been considered a slow technique, claiming many hours of SEM time and often relegated to out-of-hours (overnight) mapping. With the development of high count rate silicon high resolution drift detectors (SDD) [1, 2] and multi-detector systems [3], the time required to acquire XRM decreases. With a single EDS detector at 20kcps output, a good 512x512 quantitative map can be obtained in around 4 to 8 hours for major elements (>10wt% evenly distributed) and minor elements (>1wt% localised).
dc.publisher Cambridge University Press
dc.relation.isbasedon 10.1017/S143192760606243X
dc.subject Microscopy
dc.subject Microscopy
dc.title X-ray mapping using a multiple-EDS (DUAL) detector
dc.type Conference Proceeding
dc.parent Proceedings of Microscopy & Microanalysis 12, suppl. 2, 2006
dc.publocation USA en_US
dc.publocation USA
dc.publocation USA
dc.publocation USA
dc.identifier.startpage 1406 en_US
dc.identifier.endpage 1407 en_US
dc.cauo.name SCI.Physics and Advanced Materials en_US
dc.conference Verified OK en_US
dc.conference Microscopy & Microanalysis
dc.conference Microscopy & Microanalysis
dc.conference Microscopy & Microanalysis
dc.for 0299 Other Physical Sciences
dc.for 1007 Nanotechnology
dc.for 029904 Synchrotrons; Accelerators; Instruments and Techniques
dc.personcode 880536 en_US
dc.personcode 0000022654 en_US
dc.personcode 810070 en_US
dc.personcode 0000029701 en_US
dc.percentage 60 en_US
dc.classification.name Synchrotrons; Accelerators; Instruments and Techniques en_US
dc.classification.type FOR-08 en_US
dc.custom Microscopy & Microanalysis en_US
dc.date.activity 20060730 en_US
dc.date.activity 2006-07-30
dc.date.activity 2006-07-30
dc.date.activity 2006-07-30
dc.location.activity Chicago USA en_US
dc.location.activity Chicago USA
dc.location.activity Chicago USA
dc.location.activity Chicago USA
pubs.embargo.period Not known
pubs.organisational-group /University of Technology Sydney
pubs.organisational-group /University of Technology Sydney/Faculty of Science
pubs.organisational-group /University of Technology Sydney/Strength - Materials and Technology for Energy Efficiency


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