X-ray Mapping using Multiple EDS and WDS Detectors

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dc.contributor.author Wuhrer, R
dc.contributor.author Moran, K
dc.contributor.author Phillips, M
dc.contributor.author Davey, P
dc.contributor.editor al, RPE
dc.date.accessioned 2009-06-26T04:16:22Z
dc.date.issued 2005-01
dc.identifier.citation Proceeding Microscopy and Microanalysis Vol 11 (Suppl2), 2005, 11 pp. 1678 - 1679
dc.identifier.issn 1431-9276
dc.identifier.other E1UNSUBMIT en_US
dc.identifier.uri http://hdl.handle.net/10453/789
dc.description.abstract High quality x-ray mapping (XRM) has been used for over 30 years by experienced wavelength dispersive spectroscopy (WDS) operators. Manufacturers have been developing similar techniques using energy dispersive spectroscopy (EDS) over the last 20 years. This has been generally unsuccssful due to a number of problems such as poor computer specifications, cost, time to map and generally poor peak to bacjground ratios (P:B). With improvements in all the above parameters EDS mapping is now gaining in popularity.
dc.publisher Cambridge University Press
dc.relation.isbasedon 10.1017/S1431927605504859
dc.title X-ray Mapping using Multiple EDS and WDS Detectors
dc.type Conference Proceeding
dc.parent Proceeding Microscopy and Microanalysis Vol 11 (Suppl2)
dc.journal.volume 11
dc.journal.number en_US
dc.publocation United Kingdom en_US
dc.publocation United Kingdom
dc.identifier.startpage 1678 en_US
dc.identifier.endpage 1679 en_US
dc.cauo.name SCI.Physics and Advanced Materials en_US
dc.conference Verified OK en_US
dc.conference Microscopy and Microanalysis
dc.conference Microscopy and Microanalysis
dc.conference.location Honolulu USA en_US
dc.for 1007 Nanotechnology
dc.personcode 810070
dc.personcode 880536
dc.percentage 100 en_US
dc.classification.name Materials Engineering en_US
dc.classification.type FOR-08 en_US
dc.custom Microscopy and Microanalysis en_US
dc.date.activity 20050731 en_US
dc.date.activity 2005-07-31
dc.date.activity 2005-07-31
dc.location.activity Honolulu, USA en_US
dc.location.activity Honolulu, USA
dc.description.keywords NA
pubs.embargo.period Not known
pubs.organisational-group /University of Technology Sydney
pubs.organisational-group /University of Technology Sydney/Faculty of Science
pubs.organisational-group /University of Technology Sydney/Strength - Materials and Technology for Energy Efficiency
utslib.copyright.status Closed Access
utslib.copyright.date 2015-04-15 12:23:47.074767+10
pubs.consider-herdc false
utslib.collection.history General Collection (ID: 346) [2015-05-15T14:11:26+10:00]
utslib.collection.history General (ID: 2)

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