A Bayesian/Maximum Entropy Method for Certification of a Nanocrystalline-Size NIST Reference Material

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dc.contributor.author Armstrong, NG
dc.contributor.author Kalceff, W
dc.contributor.author Cline, JP
dc.contributor.author Bonevich, JE
dc.contributor.editor Mittemeijer, EJ
dc.contributor.editor Scardi, P
dc.date.accessioned 2009-06-26T04:18:15Z
dc.date.issued 2004-01
dc.identifier.citation Diffraction Analysis of the Microstructure of Materials, 2004, 1, pp. 187 - 227
dc.identifier.isbn 3-540-40519-4
dc.identifier.other B1 en_US
dc.identifier.uri http://hdl.handle.net/10453/804
dc.description.abstract NA
dc.publisher Springer Verlag
dc.title A Bayesian/Maximum Entropy Method for Certification of a Nanocrystalline-Size NIST Reference Material
dc.type Chapter
dc.parent Diffraction Analysis of the Microstructure of Materials
dc.publocation Berlin, Germany en_US
dc.publocation Berlin, Germany
dc.identifier.startpage 187 en_US
dc.identifier.endpage 227 en_US
dc.cauo.name SCI.Physics and Advanced Materials en_US
dc.conference Verified OK en_US
dc.for 0204 Condensed Matter Physics
dc.personcode 800088
dc.personcode 921034
dc.percentage 100 en_US
dc.classification.name Condensed Matter Physics en_US
dc.classification.type FOR-08 en_US
dc.edition 1 en_US
dc.edition 1
dc.description.keywords NA
pubs.embargo.period Not known
pubs.organisational-group /University of Technology Sydney
pubs.organisational-group /University of Technology Sydney/Faculty of Science
utslib.copyright.status Closed Access
utslib.copyright.date 2015-04-15 12:17:09.805752+10
pubs.consider-herdc true
utslib.collection.history School of Physics and Advanced Materials (ID: 343)
utslib.collection.history Closed (ID: 3)
utslib.collection.history School of Physics and Advanced Materials (ID: 343)


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