Image fidelity for single - layer and multi-layer silver superlenses

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Show simple item record Moore, CP Arnold, MD Bones, PJ Blaikie, RJ 2010-05-28T09:42:41Z 2008-04-01
dc.identifier.citation Journal of the Optical Society of America A: Optics and Image Science, and Vision, 2008, 25 (4), pp. 911 - 918
dc.identifier.issn 1084-7529
dc.identifier.other C1 en_US
dc.description.abstract In response to increasing interest in the area of subdiffraction-limited near-field imaging, the performance of several different realizable and theoretical superresolving silver-based lenses is simulated for a variety of different input object profiles. A computationally-efficient T-matrix technique is used to model the lenses, which consist of layers of silver with total width of 40 nm sandwiched between layers of polymethyl methacrylate and silicon dioxide. The lenses are exposed to nonperiodic bright- and dark-slit input patterns, with feature size varied between 1 nm and 2.5 μm. The performance of the lenses is characterized in terms of transfer function, contrast profile, error profile, and input-to-output correlation. It is shown that increasing the number of layers in a lens increases the lens' transmission coefficients at high spatial frequencies; however, this does not always lead to better imaging performance. The main reasons for this are lens-specific resonances that distort features at certain spatial frequencies, and the increased attenuation of the DC component of transmitted images, which reduces image fidelity, particularly for dark-line features. This suggests that, to achieve optimum results, the design of the superresolving lens system should take into account the characteristics of the images that it is expected to transmit. © 2008 Optical Society of America.
dc.language eng
dc.publisher Optical Society of American (OSA)
dc.relation.isbasedon 10.1364/JOSAA.25.000911
dc.title Image fidelity for single - layer and multi-layer silver superlenses
dc.type Journal Article
dc.parent Journal of the Optical Society of America A: Optics and Image Science, and Vision
dc.journal.volume 4
dc.journal.volume 25
dc.journal.number 4 en_US
dc.publocation Washington DC, USA en_US
dc.identifier.startpage 911 en_US
dc.identifier.endpage 918 en_US SCI.Physics and Advanced Materials en_US
dc.conference Verified OK en_US
dc.for 0205 Optical Physics
dc.personcode 999147
dc.percentage 100 en_US Optical Physics en_US
dc.classification.type FOR-08 en_US
dc.edition en_US
dc.custom en_US en_US
dc.location.activity en_US
pubs.embargo.period Not known
pubs.organisational-group /University of Technology Sydney
pubs.organisational-group /University of Technology Sydney/Faculty of Science
utslib.copyright.status Open Access 2015-04-15 12:23:47.074767+10
pubs.consider-herdc true
utslib.collection.history General (ID: 2)
utslib.collection.history School of Physics and Advanced Materials (ID: 343)

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