SEM characterization of nanodevices and nanomaterials
- Publication Type:
- Conference Proceeding
- Citation:
- Proceedings of the 2006 International Conference on Nanoscience and Nanotechnology, ICONN, 2006, pp. 596 - 599
- Issue Date:
- 2006-12-01
Closed Access
Filename | Description | Size | |||
---|---|---|---|---|---|
2006005793OK.pdf | 733.97 kB |
Copyright Clearance Process
- Recently Added
- In Progress
- Closed Access
This item is closed access and not available.
The scanning electron microscope (SEM) can be used to study and characterize a wide variety of materials used in nanoelectronic and photonic applications. Several different techniques make use of this versatile tool. These include voltage contrast in secondary electron imaging, charge collection for semiconductor samples and cathodoluminescence. These techniques are important in device nanofabrication process development and nanomaterials characterization. © 2006 IEEE.
Please use this identifier to cite or link to this item: