Iterative Coarse to Fine Approach for Interpretation of Defect Profiles Using MFL Measurements
- Publisher:
- IEEE
- Publication Type:
- Conference Proceeding
- Citation:
- PROCEEDINGS OF THE 2015 10TH IEEE CONFERENCE ON INDUSTRIAL ELECTRONICS AND APPLICATIONS, 2015, pp. 1104 - 1109 (6)
- Issue Date:
- 2015-01-01
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