Local metric learning for exemplar-based object detection

Publication Type:
Journal Article
Citation:
IEEE Transactions on Circuits and Systems for Video Technology, 2014, 24 (8), pp. 1265 - 1276
Issue Date:
2014-01-01
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Object detection has been widely studied in the computer vision community and it has many real applications, despite its variations, such as scale, pose, lighting, and background. Most classical object detection methods heavily rely on category-based training to handle intra-class variations. In contrast to classical methods that use a rigid category-based representation, exemplar-based methods try to model variations among positives by learning from specific positive samples. However, current existing exemplar-based methods either fail to use any training information or suffer from a significant performance drop when few exemplars are available. In this paper, we design a novel local metric learning approach to well handle exemplar-based object detection task. The main works are two-fold: 1) a novel local metric learning algorithm called exemplar metric learning (EML) is designed and 2) an exemplar-based object detection algorithm based on EML is implemented. We evaluate our method on two generic object detection data sets: UIUC-Car and UMass FDDB. Experiments show that compared with other exemplar-based methods, our approach can effectively enhance object detection performance when few exemplars are available. © 2014 IEEE.
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