Accuracy analysis of structure with nearby interfaces within XFEM
- Publication Type:
- Journal Article
- AIP Advances, 2017, 7 (5)
- Issue Date:
© 2017 Author(s). This paper presents the fundamental principle of the extended finite element method (XFEM) for electromagnetic field analysis. The accuracy analysis of structure with nearby interfaces within XFEM is presented. A numerical example applied to the parallel plate electrodes in 1-D static electric field is provided. Two types of meshing are used to analyse the accuracy of the meshing where the support of the enriched node are cut by more than one interface.
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