Accuracy analysis of structure with nearby interfaces within XFEM

Duan, N; Xu, W; Wang, S; Zhu, J

Accuracy analysis of structure with nearby interfaces within XFEM

Duan, N Xu, W Wang, S Zhu, J

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Publication Type:: Journal Article
Citation:: AIP Advances, 2017, 7 (5)
Issue Date:: 2017-05-01

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Field	Value	Language
dc.contributor.author	Duan, N	en_US
dc.contributor.author	Xu, W	en_US
dc.contributor.author	Wang, S	en_US
dc.contributor.author	Zhu, J https://orcid.org/0000-0002-9763-4047	en_US
dc.date.issued	2017-05-01	en_US
dc.identifier.citation	AIP Advances, 2017, 7 (5)	en_US
dc.identifier.uri	http://hdl.handle.net/10453/123380
dc.description.abstract	© 2017 Author(s). This paper presents the fundamental principle of the extended finite element method (XFEM) for electromagnetic field analysis. The accuracy analysis of structure with nearby interfaces within XFEM is presented. A numerical example applied to the parallel plate electrodes in 1-D static electric field is provided. Two types of meshing are used to analyse the accuracy of the meshing where the support of the enriched node are cut by more than one interface.	en_US
dc.relation.ispartof	AIP Advances	en_US
dc.relation.isbasedon	10.1063/1.4974983	en_US
dc.rights	info:eu-repo/semantics/openAccess
dc.title	Accuracy analysis of structure with nearby interfaces within XFEM	en_US
dc.type	Journal Article
utslib.citation.volume	5	en_US
utslib.citation.volume	7	en_US
utslib.for	0299 Other Physical Sciences	en_US
utslib.for	0205 Optical Physics	en_US
utslib.for	0206 Quantum Physics	en_US
utslib.for	0906 Electrical and Electronic Engineering	en_US
pubs.embargo.period	Not known	en_US
pubs.organisational-group	/University of Technology Sydney
pubs.organisational-group	/University of Technology Sydney/Faculty of Engineering and Information Technology
pubs.organisational-group	/University of Technology Sydney/Faculty of Engineering and Information Technology/School of Electrical and Data Engineering
pubs.organisational-group	/University of Technology Sydney/Strength - CCET - Centre for Clean Energy Technology
utslib.copyright.status	open_access	*
pubs.issue	5	en_US
pubs.publication-status	Published	en_US
pubs.volume	7	en_US

Abstract:

© 2017 Author(s). This paper presents the fundamental principle of the extended finite element method (XFEM) for electromagnetic field analysis. The accuracy analysis of structure with nearby interfaces within XFEM is presented. A numerical example applied to the parallel plate electrodes in 1-D static electric field is provided. Two types of meshing are used to analyse the accuracy of the meshing where the support of the enriched node are cut by more than one interface.

Please use this identifier to cite or link to this item:

http://hdl.handle.net/10453/123380