An In Situ Method For The Study Of Strain Broadening Using Synchrotron X-ray Diffraction

Publisher:
Blackwell Publishing
Publication Type:
Journal Article
Citation:
Journal Of Applied Crystallography, 2007, 40 (0), pp. 642 - 649
Issue Date:
2007-01
Full metadata record
Files in This Item:
Filename Description Size
Thumbnail2006015335.pdf615.57 kB
Adobe PDF
A tensonometer for stretching metal foils has been constructed for the study of strain broadening in X-ray diffraction line profiles. This device, which is designed for use on powder diffractometers and was tested on Station 2.3 at Daresbury Laboratory,
Please use this identifier to cite or link to this item: