A Rietveld refinement investigation of a Mg-stabilised tricline tricalcium silicate using synchrotron x-ray power diffraction

Peterson, VK

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Field	Value	Language
dc.contributor.author	Peterson, VK
dc.date.accessioned	2009-12-21T03:52:55Z
dc.date.issued	2004-01
dc.identifier.citation	Powder Diffraction, 2004, 19 (4), pp. 356 - 358
dc.identifier.issn	0885-7156
dc.identifier.other	C1	en_US
dc.identifier.uri	http://hdl.handle.net/10453/5807
dc.publisher	JCPDS-ICCD
dc.relation.ispartof	Powder Diffraction
dc.relation.isbasedon	10.1154/1.1810155
dc.rights	info:eu-repo/semantics/closedAccess
dc.title	A Rietveld refinement investigation of a Mg-stabilised tricline tricalcium silicate using synchrotron x-ray power diffraction
dc.type	Journal Article
utslib.citation.volume	19
utslib.citation.number	4	en_US
utslib.citation.startpage	356	en_US
utslib.citation.endpage	358	en_US
utslib.for	0202 Atomic, Molecular, Nuclear, Particle and Plasma Physics
pubs.embargo.period	Not known
pubs.organisational-group	/University of Technology Sydney
pubs.organisational-group	/University of Technology Sydney/Faculty of Engineering and Information Technology
pubs.organisational-group	/University of Technology Sydney/Faculty of Engineering and Information Technology/School of Civil and Environmental Engineering
utslib.copyright.status	closed_access
pubs.declined	1970-01-01T00:00:00.0+1000

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