Considerations concerning Wilkens theory of dislocation line-broadening

Armstrong, NG; Leoni, M; Scardi, P

Considerations concerning Wilkens theory of dislocation line-broadening

Armstrong, NG Leoni, M Scardi, P

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Publisher:: Oldenbourg Verlag
Publication Type:: Journal Article
Citation:: Zeitschrift Fur Kristallographie, 2006, 23 pp. 81 - 86
Issue Date:: 2006-01

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Field	Value	Language
dc.contributor.author	Armstrong, NG	en_US
dc.contributor.author	Leoni, M	en_US
dc.contributor.author	Scardi, P	en_US
dc.date.issued	2006-01	en_US
dc.identifier.citation	Zeitschrift Fur Kristallographie, 2006, 23 pp. 81 - 86	en_US
dc.identifier.issn	0044-2968	en_US
dc.identifier.uri	http://hdl.handle.net/10453/621
dc.description.abstract	When applying Wilkens' dislocation line broadening theory, the dependence on each individual slip system need to be considered, since the Fourier coefficients result from a convolution product over all active slip-systems. Corresponding diffraction profi	en_US
dc.publisher	Oldenbourg Verlag	en_US
dc.relation.ispartof	Zeitschrift Fur Kristallographie	en_US
dc.relation.isbasedon	10.1524/zksu.2006.suppl_23.81	en_US
dc.subject.classification	Inorganic & Nuclear Chemistry	en_US
dc.title	Considerations concerning Wilkens theory of dislocation line-broadening	en_US
dc.type	Journal Article
utslib.citation.volume	23	en_US
utslib.for	0306 Physical Chemistry (incl. Structural)	en_US
utslib.for	0601 Biochemistry and Cell Biology	en_US
utslib.for	0904 Chemical Engineering	en_US
dc.location.activity	SEATTLE, WA
pubs.embargo.period	Not known	en_US
pubs.organisational-group	/University of Technology Sydney
pubs.organisational-group	/University of Technology Sydney/Faculty of Science
utslib.copyright.status	closed_access
pubs.consider-herdc	true	en_US
pubs.volume	23	en_US

Abstract:

When applying Wilkens' dislocation line broadening theory, the dependence on each individual slip system need to be considered, since the Fourier coefficients result from a convolution product over all active slip-systems. Corresponding diffraction profi

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http://hdl.handle.net/10453/621