A Bayesian/Maximum Entropy Method for Certification of a Nanocrystalline-Size NIST Reference Material

Armstrong, NG Kalceff, W Cline, JP Bonevich, JE

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Publisher:: Springer Verlag
Publication Type:: Chapter
Citation:: Diffraction Analysis of the Microstructure of Materials, 2004, 1, pp. 187 - 227
Issue Date:: 2004-01

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Field	Value	Language
dc.contributor.author	Armstrong, NG	en_US
dc.contributor.author	Kalceff, W	en_US
dc.contributor.author	Cline, JP	en_US
dc.contributor.author	Bonevich, JE	en_US
dc.contributor.editor	Mittemeijer, EJ	en_US
dc.contributor.editor	Scardi, P	en_US
dc.date.issued	2004-01	en_US
dc.identifier.citation	Diffraction Analysis of the Microstructure of Materials, 2004, 1, pp. 187 - 227	en_US
dc.identifier.isbn	3-540-40519-4	en_US
dc.identifier.uri	http://hdl.handle.net/10453/804
dc.description.abstract	NA	en_US
dc.publisher	Springer Verlag	en_US
dc.relation.ispartof	Diffraction Analysis of the Microstructure of Materials	en_US
dc.title	A Bayesian/Maximum Entropy Method for Certification of a Nanocrystalline-Size NIST Reference Material	en_US
dc.type	Chapter
utslib.location	Berlin, Germany	en_US
utslib.for	0204 Condensed Matter Physics	en_US
utslib.citation.edition	1	en_US
pubs.embargo.period	Not known	en_US
pubs.organisational-group	/University of Technology Sydney
pubs.organisational-group	/University of Technology Sydney/Faculty of Science
pubs.organisational-group	/University of Technology Sydney/Faculty of Science/School of Mathematical and Physical Sciences
utslib.copyright.status	closed_access
pubs.consider-herdc	true	en_US
pubs.edition	1	en_US
pubs.place-of-publication	Berlin, Germany	en_US

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