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Showing results 7 to 9 of 9
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Issue Date
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2009-07-27
Noise characteristics of the gas ionization cascade used in low vacuum scanning electron microscopy
Tileli, V
;
Knowles, WR
;
Toth, M
;
Thiel, BL
2007-01-16
Structure of low-density nanoporous dielectrics revealed by low-vacuum electron microscopy and small-angle X-ray scattering
Kucheyev, SO
;
Toth, M
;
Baumann, TF
;
Hamza, AV
;
Ilavsky, J
;
Knowles, WR
;
Saw, CK
;
Thiel, BL
;
Tileli, V
;
Van Buuren, T
;
Wang, YM
;
Willey, TM
2002-11-20
X-ray microanalysis of insulators in a variable pressure environment
Toth, M
;
Craven, JP
;
Phillips, MR
;
Thiel, BL
;
Donald, AM