Browsing byAuthorDwyer, C
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| Issue Date | Title | Author(s) |
|---|---|---|
| 2021-12-21 | Metrology of convex-shaped nanoparticles: Via soft classification machine learning of TEM images | Wen, H; Xu, X; Cheong, S; Lo, SC; Chen, JH; Chang, SLY; Dwyer, C |