Cathodoluminescence as a method of extracting detailed information from nanophotonics systems: a study of silicon nanocrystals

Dowd, A; Johansson, B; Armstrong, N; Ton-That, C; Phillips, M

Cathodoluminescence as a method of extracting detailed information from nanophotonics systems: a study of silicon nanocrystals

Dowd, A Johansson, B Armstrong, N Ton-That, C Phillips, M

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Publisher:: SPIE-Int Society Optical Engineering
Publication Type:: Conference
Citation:: Dowd Annette et al. 2006, 'Cathodoluminescence as a method of extracting detailed information from nanophotonics systems: a study of silicon nanocrystals', SPIE-Int Society Optical Engineering, Bellingham, USA, pp. J380-1-J380-10.
Issue Date:: 2006

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Field	Value	Language
dc.contributor.author	Dowd, A	en_US
dc.contributor.author	Johansson, B	en_US
dc.contributor.author	Armstrong, N	en_US
dc.contributor.author	Ton-That, C	en_US
dc.contributor.author	Phillips, M	en_US
dc.contributor.editor	Abbott, D; Kivshar, YS; RubinszteinDunlop, HH; Fan, S	en_US
dc.date	20051212	en_US
dc.date.accessioned	2010-06-16T04:59:28Z
dc.date.available	2010-06-16T04:59:28Z
dc.date.issued	2006	en_US
dc.identifier	2006004203	en_US
dc.identifier.citation	Dowd Annette et al. 2006, 'Cathodoluminescence as a method of extracting detailed information from nanophotonics systems: a study of silicon nanocrystals', SPIE-Int Society Optical Engineering, Bellingham, USA, pp. J380-1-J380-10.	en_US
dc.identifier.issn	0-8194-6069-9	en_US
dc.identifier.other	E1UNSUBMIT	en_US
dc.identifier.uri	http://hdl.handle.net/10453/11873
dc.description.abstract	We investigated Si nanocaystal samples produced by high dose 600 keV Si+ implantation of fused silica and annealing using cathodoluminescence (CL). CL spectra collected under 5-25 keV electron irradiation show similar features to reported photoluminescence	en_US
dc.publisher	SPIE-Int Society Optical Engineering	en_US
dc.relation.ispartof	Photonics: Design, Technology, And Packaging Ii	en_US
dc.relation.ispartof	Verified OK	en_US
dc.relation.isbasedon	http://dx.doi.org/10.1117/12.638662	en_US
dc.rights	Copyright 2006. Society of Photo-Optical Instrumentation Engineers. One print or electronic copy may be made for personal use only. Systematic electronic or print reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited.	en_US
dc.subject	cathodoluminescence, silicon, nanostructures, maximum entropy, inverse problem	en_US
dc.subject.classification	Condensed Matter Physics	en_US
dc.title	Cathodoluminescence as a method of extracting detailed information from nanophotonics systems: a study of silicon nanocrystals	en_US
dc.type	Conference
utslib.citation.volume	6038	en_US
utslib.location	Bellingham, USA	en_US
utslib.citation.startpage	J380-1	en_US
utslib.citation.endpage	J380-10	en_US
utslib.identifier.org	SCI.Physics and Advanced Materials	en_US
utslib.for	100700	en_US
utslib.percentage	100	en_US
dc.location.activity	Brisbane, Australia	en_US
utslib.copyright.status	open_access

Abstract:

We investigated Si nanocaystal samples produced by high dose 600 keV Si+ implantation of fused silica and annealing using cathodoluminescence (CL). CL spectra collected under 5-25 keV electron irradiation show similar features to reported photoluminescence

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http://hdl.handle.net/10453/11873