A Portable Microwave Interferometry Sensor for Permittivity Detection Based on CCMRC

Chen, S; Zhou, F; Xu, K; Zhao, P; Yang, Y; Zhu, X; Wang, G

A Portable Microwave Interferometry Sensor for Permittivity Detection Based on CCMRC

Chen, S Zhou, F Xu, K Zhao, P Yang, Y

Zhu, X

Wang, G

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Publisher:: Institute of Electrical and Electronics Engineers (IEEE)
Publication Type:: Journal Article
Citation:: IEEE Access, 2020, 8, pp. 140323-140332
Issue Date:: 2020-01-01

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Field	Value	Language
dc.contributor.author	Chen, S
dc.contributor.author	Zhou, F
dc.contributor.author	Xu, K
dc.contributor.author	Zhao, P
dc.contributor.author	Yang, Y https://orcid.org/0000-0001-7439-2156
dc.contributor.author	Zhu, X https://orcid.org/0000-0002-5814-394X
dc.contributor.author	Wang, G
dc.date.accessioned	2020-10-31T19:34:11Z
dc.date.available	2020-10-31T19:34:11Z
dc.date.issued	2020-01-01
dc.identifier.citation	IEEE Access, 2020, 8, pp. 140323-140332
dc.identifier.issn	2169-3536
dc.identifier.issn	2169-3536
dc.identifier.uri	http://hdl.handle.net/10453/143643
dc.description.abstract	© 2013 IEEE. A portable microwave complex permittivity sensor based on the interferometry configuration is proposed. A complementary compact microstrip resonant cell (CCMRC) is applied as the sensitive element, which converts the dielectric information of the material under test (MUT) into the phase variations of its transmission coefficient. A miniaturized interferometry platform based on a down-converting mixer further translates the phase change into DC output voltage variation, which can be readily recorded with a direct readout circuit. In this context, expensive and bulky vector network analyzer is no longer needed, thereby leading to a low hardware cost. With comprehensive theoretical analysis, the material permittivity is simply extracted using a specific extrapolation algorithm. As a proof of concept, several different solid material samples with known permittivity values are used to verify the devised detection system.
dc.language	en
dc.publisher	Institute of Electrical and Electronics Engineers (IEEE)
dc.relation.ispartof	IEEE Access
dc.relation.isbasedon	10.1109/ACCESS.2020.3007783
dc.rights	info:eu-repo/semantics/openAccess
dc.rights	© 2020 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.	en_US
dc.subject	08 Information and Computing Sciences, 09 Engineering, 10 Technology
dc.title	A Portable Microwave Interferometry Sensor for Permittivity Detection Based on CCMRC
dc.type	Journal Article
utslib.citation.volume	8
utslib.for	08 Information and Computing Sciences
utslib.for	09 Engineering
utslib.for	10 Technology
pubs.organisational-group	/University of Technology Sydney/Faculty of Engineering and Information Technology
pubs.organisational-group	/University of Technology Sydney/Strength - GBDTC - Global Big Data Technologies
pubs.organisational-group	/University of Technology Sydney/Faculty of Engineering and Information Technology/School of Electrical and Data Engineering
pubs.organisational-group	/University of Technology Sydney
utslib.copyright.status	open_access	*
dc.date.updated	2020-10-31T19:33:57Z
pubs.publication-status	Published
pubs.volume	8

Abstract:

© 2013 IEEE. A portable microwave complex permittivity sensor based on the interferometry configuration is proposed. A complementary compact microstrip resonant cell (CCMRC) is applied as the sensitive element, which converts the dielectric information of the material under test (MUT) into the phase variations of its transmission coefficient. A miniaturized interferometry platform based on a down-converting mixer further translates the phase change into DC output voltage variation, which can be readily recorded with a direct readout circuit. In this context, expensive and bulky vector network analyzer is no longer needed, thereby leading to a low hardware cost. With comprehensive theoretical analysis, the material permittivity is simply extracted using a specific extrapolation algorithm. As a proof of concept, several different solid material samples with known permittivity values are used to verify the devised detection system.

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http://hdl.handle.net/10453/143643