Approximate Reliability Function Based On Wavelet Latin Hypercube Sampling And Bee Recurrent Neural Network

Publisher:
IEEE-Inst Electrical Electronics Engineers Inc
Publication Type:
Journal article
Citation:
Yeh Wei-Chang et al. 2011, 'Approximate Reliability Function Based On Wavelet Latin Hypercube Sampling And Bee Recurrent Neural Network', IEEE-Inst Electrical Electronics Engineers Inc, vol. 60, no. 2, pp. 404-414.
Issue Date:
2011
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This work combines a Bee Recurrent Neural Network (BRNN) optimized by the Artificial Bee Colony (ABC) algorithm with Monte Carlo Simulation (MCS) to generate a novel approximate model for predicting network reliability. We utilize the Wavelet Transform (
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