Approximate Reliability Function Based On Wavelet Latin Hypercube Sampling And Bee Recurrent Neural Network

Yeh, W; Su, J; Hsieh, T; Chih, M; Liu, S

Approximate Reliability Function Based On Wavelet Latin Hypercube Sampling And Bee Recurrent Neural Network

Yeh, W Su, J Hsieh, T Chih, M Liu, S

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Publisher:: IEEE-Inst Electrical Electronics Engineers Inc
Publication Type:: Journal Article
Citation:: Yeh Wei-Chang et al. 2011, 'Approximate Reliability Function Based On Wavelet Latin Hypercube Sampling And Bee Recurrent Neural Network', IEEE-Inst Electrical Electronics Engineers Inc, vol. 60, no. 2, pp. 404-414.
Issue Date:: 2011

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Field	Value	Language
dc.contributor.author	Yeh, W	en_US
dc.contributor.author	Su, J	en_US
dc.contributor.author	Hsieh, T	en_US
dc.contributor.author	Chih, M	en_US
dc.contributor.author	Liu, S	en_US
dc.date.accessioned	2012-02-02T09:56:16Z
dc.date.available	2012-02-02T09:56:16Z
dc.date.issued	2011	en_US
dc.identifier	2010004084	en_US
dc.identifier.citation	Yeh Wei-Chang et al. 2011, 'Approximate Reliability Function Based On Wavelet Latin Hypercube Sampling And Bee Recurrent Neural Network', IEEE-Inst Electrical Electronics Engineers Inc, vol. 60, no. 2, pp. 404-414.	en_US
dc.identifier.issn	0018-9529	en_US
dc.identifier.other	C1	en_US
dc.identifier.uri	http://hdl.handle.net/10453/15173
dc.description.abstract	This work combines a Bee Recurrent Neural Network (BRNN) optimized by the Artificial Bee Colony (ABC) algorithm with Monte Carlo Simulation (MCS) to generate a novel approximate model for predicting network reliability. We utilize the Wavelet Transform (	en_US
dc.publisher	IEEE-Inst Electrical Electronics Engineers Inc	en_US
dc.relation.ispartof	Verified OK	en_US
dc.relation.ispartof	IEEE Transactions on Reliability	en_US
dc.relation.isbasedon	http://dx.doi.org/10.1109/TR.2011.2134190	en_US
dc.rights	© 2011 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.	en_US
dc.subject	Colony Abc Algorithm; Computer Experiments; Simulation Approach; Designs; Optimization; Performance	en_US
dc.subject.classification	Computer Software	en_US
dc.title	Approximate Reliability Function Based On Wavelet Latin Hypercube Sampling And Bee Recurrent Neural Network	en_US
dc.type	Journal article
utslib.citation.volume	60	en_US
utslib.citation.number	2	en_US
utslib.location	Piscataway	en_US
utslib.citation.startpage	404	en_US
utslib.citation.endpage	414	en_US
utslib.identifier.org	FEIT.Faculty of Engineering & Information Technology	en_US
utslib.for	080300	en_US
utslib.percentage	000100	en_US
dc.location.activity	ISI:000291317100006	en_US
utslib.copyright.status	closed_access

Abstract:

This work combines a Bee Recurrent Neural Network (BRNN) optimized by the Artificial Bee Colony (ABC) algorithm with Monte Carlo Simulation (MCS) to generate a novel approximate model for predicting network reliability. We utilize the Wavelet Transform (

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http://hdl.handle.net/10453/15173