Binary Coded Genetic Algorithm Application for Array Diagnosis

Kong, B; Liu, Y; Li, M

Binary Coded Genetic Algorithm Application for Array Diagnosis

Kong, B Liu, Y Li, M

Permalink

Publisher:: IEEE
Publication Type:: Conference Proceeding
Citation:: 2021 International Conference on Microwave and Millimeter Wave Technology, ICMMT 2021 - Proceedings, 2021, 00, pp. 1-3
Issue Date:: 2021-01-01

Closed Access

	Filename	Description	Size
	Binary_Coded_Genetic_Algorithm_Application_for_Array_Diagnosis.pdf	Published version	767.49 kB	Adobe PDF	View/Open

Copyright Clearance Process

Recently Added
In Progress
Closed Access

This item is closed access and not available.

Full metadata record

Field	Value	Language
dc.contributor.author	Kong, B
dc.contributor.author	Liu, Y
dc.contributor.author	Li, M https://orcid.org/0000-0002-2268-9334
dc.date	2021-05-23
dc.date.accessioned	2022-07-03T21:06:47Z
dc.date.available	2022-07-03T21:06:47Z
dc.date.issued	2021-01-01
dc.identifier.citation	2021 International Conference on Microwave and Millimeter Wave Technology, ICMMT 2021 - Proceedings, 2021, 00, pp. 1-3
dc.identifier.isbn	9781665434379
dc.identifier.uri	http://hdl.handle.net/10453/158568
dc.description.abstract	Retrieving the excitation distribution can find defective elements to complete the task of array diagnosis. This paper presents an array diagnosis method based on the binary coded genetic algorithm (BCGA), where a cost function defining the error between the degraded array pattern and the estimated array pattern is minimized by BCGA to obtain the excitation of each element. BCGA is much faster than the conventional genetic algorithm (GA) in finding faulty elements. An example of a planar array diagnosis is conducted to show the capability of the proposed method.
dc.language	en
dc.publisher	IEEE
dc.relation.ispartof	2021 International Conference on Microwave and Millimeter Wave Technology, ICMMT 2021 - Proceedings
dc.relation.ispartof	2021 International Conference on Microwave and Millimeter Wave Technology (ICMMT)
dc.relation.isbasedon	10.1109/ICMMT52847.2021.9618304
dc.rights	info:eu-repo/semantics/closedAccess
dc.title	Binary Coded Genetic Algorithm Application for Array Diagnosis
dc.type	Conference Proceeding
utslib.citation.volume	00
pubs.organisational-group	/University of Technology Sydney
pubs.organisational-group	/University of Technology Sydney/Faculty of Engineering and Information Technology
pubs.organisational-group	/University of Technology Sydney/Faculty of Engineering and Information Technology/School of Electrical and Data Engineering
utslib.copyright.status	closed_access	*
dc.date.updated	2022-07-03T21:06:46Z
pubs.finish-date	2021-05-26
pubs.publication-status	Published
pubs.start-date	2021-05-23
pubs.volume	00

Abstract:

Retrieving the excitation distribution can find defective elements to complete the task of array diagnosis. This paper presents an array diagnosis method based on the binary coded genetic algorithm (BCGA), where a cost function defining the error between the degraded array pattern and the estimated array pattern is minimized by BCGA to obtain the excitation of each element. BCGA is much faster than the conventional genetic algorithm (GA) in finding faulty elements. An example of a planar array diagnosis is conducted to show the capability of the proposed method.

Please use this identifier to cite or link to this item:

http://hdl.handle.net/10453/158568