Planogram compliance checking based on detection of recurring patterns

Liu, S; Li, W; Davis, S; Ritz, C; Tian, H

Planogram compliance checking based on detection of recurring patterns

Liu, S Li, W Davis, S Ritz, C Tian, H

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Publisher:: Institute of Electrical and Electronics Engineers
Publication Type:: Journal Article
Citation:: IEEE MultiMedia, 2016, 23, (2), pp. 54-63
Issue Date:: 2016-04-01

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Field	Value	Language
dc.contributor.author	Liu, S
dc.contributor.author	Li, W
dc.contributor.author	Davis, S
dc.contributor.author	Ritz, C
dc.contributor.author	Tian, H https://orcid.org/0000-0002-2889-6158
dc.date.accessioned	2022-08-07T20:45:20Z
dc.date.available	2022-08-07T20:45:20Z
dc.date.issued	2016-04-01
dc.identifier.citation	IEEE MultiMedia, 2016, 23, (2), pp. 54-63
dc.identifier.issn	1070-986X
dc.identifier.issn	1941-0166
dc.identifier.uri	http://hdl.handle.net/10453/159749
dc.description.abstract	© 1994-2012 IEEE. In this article, the authors propose a novel method for automatic planogram compliance checking in retail chains that doesn't require product template images for training. Product layout is extracted from an input image by means of unsupervised recurring pattern detection and matched via graph matching, with the expected product layout specified by a planogram to measure the level of compliance. A divide-and-conquer strategy is employed to improve the speed. Specifically, the input image is divided into several regions based on the planogram. Recurring patterns are detected in each region, respectively, and then merged together to estimate the product layout.
dc.language	English
dc.publisher	Institute of Electrical and Electronics Engineers
dc.relation.ispartof	IEEE MultiMedia
dc.relation.isbasedon	10.1109/MMUL.2016.19
dc.rights	info:eu-repo/semantics/closedAccess
dc.subject	08 Information and Computing Sciences, 09 Engineering
dc.subject.classification	Software Engineering
dc.title	Planogram compliance checking based on detection of recurring patterns
dc.type	Journal Article
utslib.citation.volume	23
utslib.for	08 Information and Computing Sciences
utslib.for	09 Engineering
pubs.organisational-group	/University of Technology Sydney
pubs.organisational-group	/University of Technology Sydney/Faculty of Engineering and Information Technology
pubs.organisational-group	/University of Technology Sydney/Faculty of Engineering and Information Technology/A/DRsch The Data Science Institute
utslib.copyright.status	closed_access	*
pubs.consider-herdc	false
dc.date.updated	2022-08-07T20:45:17Z
pubs.issue	2
pubs.publication-status	Published
pubs.volume	23
utslib.citation.issue	2

Abstract:

© 1994-2012 IEEE. In this article, the authors propose a novel method for automatic planogram compliance checking in retail chains that doesn't require product template images for training. Product layout is extracted from an input image by means of unsupervised recurring pattern detection and matched via graph matching, with the expected product layout specified by a planogram to measure the level of compliance. A divide-and-conquer strategy is employed to improve the speed. Specifically, the input image is divided into several regions based on the planogram. Recurring patterns are detected in each region, respectively, and then merged together to estimate the product layout.

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http://hdl.handle.net/10453/159749